Abstract
There has been considerable interest in the III–V semiconductor alloys for many device applications. Literature on the fundamental properties of these alloys is growing rapidly [1,2]. However, some practical device parameters in these materials have been hampered by a lack of definite knowledge of many material parameters. An interpolation scheme is a powerful tool for estimating some material parameters of semiconductor alloys. Although the scheme is still open to experimental verification, it provides more reliable values over the entire range of alloy composition [3].
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References
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© 1999 Springer Science+Business Media New York
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Adachi, S. (1999). General Remarks. In: Optical Constants of Crystalline and Amorphous Semiconductors. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-5247-5_28
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DOI: https://doi.org/10.1007/978-1-4615-5247-5_28
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-7923-8567-7
Online ISBN: 978-1-4615-5247-5
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