Abstract
This chapter is a tutorial on logic circuit modeling, fault modeling and test generation [5]. Concepts of testing, as used in later chapters, are briefly reviewed. Readers having a basic understanding of these concepts may choose to skip this chapter.
“Testing of large circuits can be very testing.”
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© 1991 Springer Science+Business Media New York
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Chakradhar, S.T., Agrawal, V.D., Bushneil, M.L. (1991). Logic Circuits and Testing. In: Neural Models and Algorithms for Digital Testing. The Springer International Series in Engineering and Computer Science, vol 140. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-3958-2_2
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DOI: https://doi.org/10.1007/978-1-4615-3958-2_2
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