Direct Measurements of the Saw Velocity and Attenuation Using Continuous Wave Reflection Scanning Acoustic Microscope (SAMCRUW)

Kulik, A.; Gremaud, G.; Sathish, S.

doi:10.1007/978-1-4615-3692-5_24

A. Kulik²,
G. Gremaud² &
S. Sathish²

Part of the book series: Acoustical Imaging ((ACIM,volume 18))

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5 Citations

Abstract

Scanning Acoustic Microscopy (SAM) has already several applications in Material Science. However interpretation of SAM images is not straightforward, since contrast can have several origins:

Topography of the surface
Local Acoustic Impedance and Bulk Acoustic Waves propagation constants
Surface Acoustic Wave (SAW) propagation constants

Therefore possibility of imaging separately different physical properties can enlarge domain of SAM applications.

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References

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A. Kulik, G. Gremaud and S. Sathish, Continuous Wave Reflection Scanning Acoustic Microscope (SAMCRUW), in: “Acoustical Imaging,” vol. 17, 71 (1988), ed. H. Shimizu, N. Chubachi and J. Kushibiki.
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Authors and Affiliations

Ecole Polytechnique Fédérale de Lausanne, Institut de Génie Atomique, CH-1015, Lausanne, Switzerland
A. Kulik, G. Gremaud & S. Sathish

Authors

A. Kulik
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G. Gremaud
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S. Sathish
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University of California at Santa Barbara, Santa Barbara, California, USA
Hua Lee & Glen Wade &

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Kulik, A., Gremaud, G., Sathish, S. (1991). Direct Measurements of the Saw Velocity and Attenuation Using Continuous Wave Reflection Scanning Acoustic Microscope (SAMCRUW). In: Lee, H., Wade, G. (eds) Acoustical Imaging. Acoustical Imaging, vol 18. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-3692-5_24

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DOI: https://doi.org/10.1007/978-1-4615-3692-5_24
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-6641-6
Online ISBN: 978-1-4615-3692-5
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