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Design for Testability

  • Phil P. Marcoux
Chapter
  • 79 Downloads

Abstract

Electrical testing is the traditional way to verify the proper functioning and parametric conformance of products for the past two decades. The systems utilized, such as in-circuit or ICT and functional testers, provide a way to power on the assembly and to indicate if it is working. Depending on the tester’s capabilities it may be able to offer a diagnosis of what’s wrong if the assembly does not work.

Keywords

Device Under Test Test Circuit Fine Pitch Tall Component False Failure 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    Fasang, P. 1990. Boundary Scan Addresses Parametric Test Issues. In ASIC Technology and News, Oct. 1990.Google Scholar
  2. 2.
    McElenery, J. 1991. Testing Loaded PCBs With Care. In Electronic Engineering Times, Nov. 1991.Google Scholar
  3. 3.
    Turin, J. 1990. Testability Bus Standards in the 1990s. Proceedings of Nepcon West ‘80, Feb. 1990: Anaheim, CA.Google Scholar
  4. 4.
    Whetsel, L. and Coleman, J. 1991. Boundary-Scan Testing. In Electronics Engineering Times, March, 1991.Google Scholar
  5. 5.
    — 1991.Testability Guidelines, TP-101A. Edina, MN: Surface Mount Technology Association.Google Scholar

Copyright information

© Springer Science+Business Media New York 1992

Authors and Affiliations

  • Phil P. Marcoux
    • 1
  1. 1.PPM Associates, Inc.SunnyvaleUSA

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