Abstract
Raman scattering has been used extensively to study various aspects of electronic excitations in low dimensional semiconductor structures. Shortly after the first proposal by Burstein et al.1 which was based on resonant electronic light scattering experiments in n-type bulk GaAs2, the first observations of intersubband transitions in GaAs/AlxGa1-xAs heterojunctions3 and quantum wells4 were reported. It became clear very soon that this technique offers the unique possibility to separate single particle and collective electronic excitations in two-dimensional electron systems. Numerous publications appeared since then for many semiconductor structures under different conditions. These include also plasmon excitations in low-dimensional systems5,6. An overview of the various aspects is given in the recent articles in Topics in Applied Physics IV and V8, and in the proceedings of a related NATO workshop held at Mont Tremblant in 19909. For more details the interested reader is refered to these review articles and the original references given therein.
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References
E. Burstein, A. Pinczuk, and S. Buchner, in Physics of Semiconductors, ed. B. L. H. Wilson (The Institute of Physics, London, 1979) p. 1231.
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G. Abstreiter, M. Cardona, and A. Pinczuk, in Light Scattering in Solids IV, eds. M. Cardona and G. Guntherodt, Topics Appl. Phys., Vol. 54 (Springer, Berlin, Heidelberg, 1984) p.5.
A. Pinczuk and G. Abstreiter, in Light Scattering in Solids V, eds. M. Cardona and G. Giintherodt, Topics Appl. Phys., Vol. 66 (Springer, Berlin, Heidelberg, 1989) p. 153.
NATO Advanced research workshop on Light Scattering in Semiconductor Structures and Superlattices, Mont Tremblant, Canada, eds. D. J. Lockwood and J. F. Young, Plenum (1991) in press.
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Abstreiter, G. (1992). Inelastic Light Scattering of Electronic Excitations in Quantum Wells. In: Rosencher, E., Vinter, B., Levine, B. (eds) Intersubband Transitions in Quantum Wells. NATO ASI Series, vol 288. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-3346-7_24
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DOI: https://doi.org/10.1007/978-1-4615-3346-7_24
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