Abstract
This is an application-oriented article on I DDQ to guide test engineers to a pragmatic method of implementing I DDQ . This article focuses on different aspects of I DDQ testing; quality, reliability, and test implementation. A description of I DDQ is presented, with different practical methods of implementing it, with empirical reliability data of I DDQ failures, and with empirical burn-in data identifying potential yield benefits. Employing I DDQ testing on digital CMOS technology, the user obtains a product with greater reliability. The data presented within this article, along with increasing customer focus on zero defects, clearly support IDDQ implementation.
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© 1992 Springer Science+Business Media Dordrecht
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McEuen, S.D. (1992). Reliability Benefits of I DDQ . In: Gulati, R.K., Hawkins, C.F. (eds) IDDQ Testing of VLSI Circuits. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-3146-3_4
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DOI: https://doi.org/10.1007/978-1-4615-3146-3_4
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-6377-4
Online ISBN: 978-1-4615-3146-3
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