On the Near-Field Optical Microscopy: A Theoretical Consideration

Abstract

The technique of Near —field Optical Microscopy (NFOM)^➁ can be used to obtain microscopic resolutions well below the wavelength of light. In this paper, a theoretical analysis based on a microscopic description of the interaction between the dielectric probe and the tested surface is presented. The probe tip is assumed to be a point — like sphere and the surface is represented by a two—dimensional discrete lattice with subwavelength structure. Using a Green’s function technique we established a set of selfconsistent integral equations to describe the local field at the site of the probe tip and the selvedge. All contributions including bulk reflection and many—body interactions have been taken into account. Using point —dipole approach we have solved the selfconsistent equations exactly.