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Low-Temperature Scanning Acoustic Microscopy in Range of 85–225K

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Part of the book series: Acoustical Imaging ((ACIM,volume 20))

Abstract

Although acoustic microscopy is well-known to be an effective nondestructive control of local elastic and structural properties in the bulk of both opaque and transparent materials, the applicability of commercial scanning acoustic microscopes (SAM) is limited to temperatures near ambient, because SAM calls for the use of on immersion liquid. On the other hand, since the discovery of high-Tc superconductivity, there is a rapidly growing interest in non-destructive lowtemperature examination of ceramics, crystals and devices made out of these materials. It is interesting to investigate other materials also in low-temperature region.

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References

  • Chernozatonskii L.A., Abilov G.S. et al., 1991, Low-temperature chamber for scanning acoustic microscope. Russian patent from 29 oct. 1991

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© 1993 Springer Science+Business Media New York

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Maev, R.G. et al. (1993). Low-Temperature Scanning Acoustic Microscopy in Range of 85–225K. In: Wei, Y., Gu, B. (eds) Acoustical Imaging. Acoustical Imaging, vol 20. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-2958-3_34

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  • DOI: https://doi.org/10.1007/978-1-4615-2958-3_34

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-6286-9

  • Online ISBN: 978-1-4615-2958-3

  • eBook Packages: Springer Book Archive

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