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Ellipsometry in Electrochemistry

  • Chapter
Modern Aspects of Electrochemistry

Part of the book series: Modern Aspects of Electrochemistry ((MAOE,volume 25))

Abstract

Ellipsometry is an experimental technique measuring changes in polarization (elliptical polarization in general) of light to obtain information on materials, especially those in the phase boundary regions. In the usual mode of ellipsometry operation, a beam of polarized light is reflected at a non-normal angle from a flat surface, which may be covered with a thin film, and the resulting change in the polarization of light is measured. This technique is useful for investigating thin films as well as bulk materials. Ellipsometry has been applied to studies of a wide range of electrochemical systems for the past three decades, such as in studies of films on metals formed by passivation or otherwise, in measurements of adsorption of ionic and molecular species, in electrodeposition studies, and in investigations of conducting polymers.

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Authors and Affiliations

  1. Department of Chemistry, Sogang University, Seoul, 121-742, Korea

    Woon-kie Paik

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  1. Woon-kie Paik
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Editors and Affiliations

  1. Department of Chemistry, Texas A&M University, College Station, Texas, USA

    J. O’M. Bockris

  2. Department of Chemistry, University of Ottawa, Ottawa, Ontario, Canada

    B. E. Conway

  3. Department of Chemical Engineering, University of South Carolina, Columbia, South Carolina, USA

    Ralph E. White

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Paik, Wk. (1993). Ellipsometry in Electrochemistry. In: Bockris, J.O., Conway, B.E., White, R.E. (eds) Modern Aspects of Electrochemistry. Modern Aspects of Electrochemistry, vol 25. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-2876-0_4

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