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Ion microprobe analysis in geology

  • Chapter
Microprobe Techniques in the Earth Sciences

Part of the book series: The Mineralogical Society Series ((MIBS,volume 6))

Abstract

For many years it has been possible to measure accurately the small-scale variations in the major and minor element chemistry of minerals by the electron microprobe technique, in which the sample surface is bombarded with an electron beam and the X-ray signal is measured (Chapter 2). Abundances of isotopes, trace and ultra-light elements (e.g. H and Li) which cannot be determined by this method can, however, be measured by secondary ion mass spectrometry (SIMS; Shimizu, Semet and Allègre, 1978; Shimizu and Hart, 1982; Reed, 1989; Zinner, 1989). The ion microprobe is a SIMS instrument with a focused primary ion beam, which permits in situ microanalysis of minerals in samples prepared as standard polished sections. Nearly all elements from H to U can be detected and many can be analysed quantitatively down to part-per-million levels, or below.

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Authors and Affiliations

  1. Department of Geology and Geophysics, University of Edinburgh, West Mains Road, Edinburgh, EH9 3JW, UK

    Richard W. Hinton

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  1. Richard W. Hinton
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Editors and Affiliations

  1. Department of Earth Sciences, The Open University, Milton Keynes, MK7 6AA, UK

    Philip J. Potts

  2. Mineral Science Ltd, Chesham, HP5 2PZ, UK

    John F. W. Bowles

  3. Department of Earth Sciences, University of Cambridge, CB2 3EQ, UK

    Stephen J. B. Reed

  4. Analytical Geochemistry Group, British Geological Survey, Keyworth, Nottingham, NG12 5GG, UK

    Mark R. Cave

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© 1995 The Mineralogical Society

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Hinton, R.W. (1995). Ion microprobe analysis in geology. In: Potts, P.J., Bowles, J.F.W., Reed, S.J.B., Cave, M.R. (eds) Microprobe Techniques in the Earth Sciences. The Mineralogical Society Series, vol 6. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-2053-5_6

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  • DOI: https://doi.org/10.1007/978-1-4615-2053-5_6

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