Skip to main content

Abstract

Higher levels of product and service quality are clearly demanded in the marketplace. Also, high quality is no longer restricted to expensive products. Cost is an important constituent of quality. Low-cost products that meet the functional objectives of the customer are an important element in the strategy of any company that hopes to be competitive in the global marketplace. Customer-oriented companies respond aggressively to these high expectations. The benchmark of quality today spurs competition for better products tomorrow. This has been seen in the consumer products industry with notable examples in automobiles, electronics, and cameras. In the computer industry, there is the additional drive for defect-free products because of the usage of on-line systems. They are crucial for the basic operation of businesses such as retail sales, reservations, financial operations, and manufacturing control systems. One solution is redundancy or “fail soft” approaches. They are effective but add to the system cost and complexity. The ideal solution is defect-free system components and assemblies. The technologist must strive for perfect products. This book is about diagnostics for defects in the microelectronics industry. Defects will occur during development of rapidly advancing, high-technology products. It is essential to understand and eliminate them as soon as possible. At least as important is the effort to prevent defects from ever occurring. This chapter discusses methods of developing and manufacturing products that are defect-free.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 169.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 219.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  • Bemoswski, K. 1991. The Quality Forum. Quality Progress Vol. 24, pp. 17–20.

    Google Scholar 

  • Blodgett, A. J. and Barbour, D. R. 1982. Thermal Conduction Module: A High-Performance Multi-Layer Ceramic Package. IBM J. Res. Devel. Vol. 26, pp. 30–36.

    Article  Google Scholar 

  • Box, G. E. P., Hunter, W. G., and Hunter, J. S. 1978. Statistics for Experimenters. NY: John Wiley and Sons.

    MATH  Google Scholar 

  • Box, G. E. P. and Draper, N. R. 1987. Empirical Model Building and Response Surfaces. NY: John Wiley and Sons.

    MATH  Google Scholar 

  • Breyfogle, W. F. III. 1992. Statistical Methods for Testing, Development, and Manufacturing. NY: John Wiley and Sons.

    Google Scholar 

  • Chang, J. P. July 1991. Monte Carlo Simulations Aid Circuit Design Tolerance Analysis. Electronic Packaging and Production,1 pp. 82–84.

    Google Scholar 

  • Derringer, G. and Suich, R. 1980. Simultaneous Optimization of Several Response Variables. J. Quality Technol. Vol. 12, No. 4, pp. 214–219.

    Google Scholar 

  • Diamond, W. J. 1989. Practical Experiment Designs. NY: Van Nostrand Reinhold.

    Google Scholar 

  • Fortuna, R. M. June 1988. Beyond Quality: Taking SPC Upstream. Quality Progress,1 p. 23.

    Google Scholar 

  • Gurian, M. 1987. Process Effects Analysis for Fine Line Production. IPC Paper WCIV-28.

    Google Scholar 

  • Gurian, M. 1990. Fine-Line Processing: the ‘80s are Here! Printed Circuit Fabrication Vol. 13, No. 5.

    Google Scholar 

  • Hairabedian, B. et al. 1985. Large Screen AC Plasma Display Technology Overview. Disp. Technol. Vol. 1, pp. 5–24.

    Google Scholar 

  • Harrington, C. E. 1965. The Desirability Function. Indust. Quality Contr. Vol. 21, No. 10, pp. 494–498.

    Google Scholar 

  • Harry, M. 1986. The Nature of Six Sigma Quality. Schaumburg, IL: Motorola University Press, Motorola, Inc.

    Google Scholar 

  • Phadke, M. S. et al. 1983. Off-Line Quality Control in Integrated Circuit Fabrication Using Experimental Design. Bell Sys. Tech. J. Vol. 62, No. 5, pp. 1273–1309.

    Google Scholar 

  • Phadke, M. S. 1989. Quality Engineering Using Robust Design. Englewood Cliffs, NJ: Prentice Hall.

    Google Scholar 

  • Ross, P. J. 1988. Taguchi Techniques for Quality Engineering. NY: McGraw-Hill.

    Google Scholar 

  • Taguchi, G. 1986. Introduction to Quality Engineering. Tokyo: Asian Productivity Organization.

    Google Scholar 

  • Young, D. L. et al. Jan. 1991. Application of Statistical Design and Response Surface Methods to Computer-Aided VLSI Device Design II: Desirability Functions and Taguchi Methods. IEEE Trans. on Computer-Aided Des. Vol. 10, pp. 103–115.

    Article  Google Scholar 

  • Zimmerman, W. 1983, “Screening Tests to Monitor Early Life Failures.” In Proc. Reliability and Maintainability. Symposium,1 pp. 443–447.

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Editor information

Abraham H. Landzberg

Rights and permissions

Reprints and permissions

Copyright information

© 1993 Springer Science+Business Media New York

About this chapter

Cite this chapter

Blake, B.E., Lorenzen, J.A. (1993). Defect Prevention. In: Landzberg, A.H. (eds) Microelectronics Manufacturing Diagnostics Handbook. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-2029-0_20

Download citation

  • DOI: https://doi.org/10.1007/978-1-4615-2029-0_20

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-5840-4

  • Online ISBN: 978-1-4615-2029-0

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics