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Microelectronics Manufacturing Diagnostics Handbook pp 9–35Cite as

Manufacturing Yield

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Abstract

Primary drivers of the microelectronics technology are cost and performance. Within a given process technology and electronic system function, the system specifications dictate the circuit design and architecture needed to achieve the required performance. The design is partitioned into integrated circuit (IC) chips to optimize cost and technology. In turn, cost is dependent on manufacturing yield, which is the thrust of yield management at the initiation of a new technology, and the focus of this chapter.

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Authors and Affiliations

  1. IBM Corporation, East Fishkill, New York, USA

    P. J. Bonk, M. R. Gupta, R. A. Hamilton & A. V. S. Satya

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  1. P. J. Bonk
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  2. M. R. Gupta
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  3. R. A. Hamilton
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  4. A. V. S. Satya
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Abraham H. Landzberg

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© 1993 Springer Science+Business Media New York

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Bonk, P.J., Gupta, M.R., Hamilton, R.A., Satya, A.V.S. (1993). Manufacturing Yield. In: Landzberg, A.H. (eds) Microelectronics Manufacturing Diagnostics Handbook. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-2029-0_2

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  • DOI: https://doi.org/10.1007/978-1-4615-2029-0_2

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-5840-4

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