Measurement of Acoustoelastic Coefficient of Surface Waves with Scanning Acoustic Microscope
A Scanning Acoustic Microscope (SAM) is a device used to identify the difference of the local acoustic properties at surface or subsurface of solid materials using high frequency surface wave, usually above 100 MHz. The major function of the SAM is to visualize the internal microstructures of materials. The other is to measure the surface wave velocity with the V(Z) curve. If the surface wave velocity could be accurately measured using the V(Z) curve, it is possible to evaluate the surface stresses within very localized region with the acoustoelastic law.
Unable to display preview. Download preview PDF.
- 1.T. Narita, K. Miura, I. Ishikawa and T. Ishikawa, Japan Inst. Materials 54(10)(1990), 1142.Google Scholar
- 2.H. Toda, S. Sakanaka and H. Fukuoka, Proc. of Japan Society of Mechanical Engineers No. 924-1(1992), 10.Google Scholar
- 3.Y.C. Lee, J.O. Kim and J.D. Achenbach, in Review of Progress in QNDE Vol. 13 (1994), 2025.Google Scholar
- 6.A. Briggs, Acoustic Microscopy, Oxford Univ. Press, Oxford (1992), 35.Google Scholar
- 8.Y.C. Lee, J.O. Kim and J.D. Achenbach, in Review of Progress in QNDE Vol. 12 (1993), 1791.Google Scholar
- 9.A. Zeiger and K. Jassby, Journal of NDE Vol. 3, No.2(1982), 115.Google Scholar
- 10.K. Jassby and D. Saltoun, Material Evaluation 40(1982). 198.Google Scholar