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Measurement of Acoustoelastic Coefficient of Surface Waves with Scanning Acoustic Microscope

  • Motohiro Okade
  • Kiyofumi Mizuno
  • Koichiro Kawashima
Chapter

Abstract

A Scanning Acoustic Microscope (SAM) is a device used to identify the difference of the local acoustic properties at surface or subsurface of solid materials using high frequency surface wave, usually above 100 MHz. The major function of the SAM is to visualize the internal microstructures of materials. The other is to measure the surface wave velocity with the V(Z) curve. If the surface wave velocity could be accurately measured using the V(Z) curve, it is possible to evaluate the surface stresses within very localized region with the acoustoelastic law.

Keywords

Aluminum Alloy Surface Wave Silica Glass Tensile Testing Machine Scan Acoustic Microscope 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Press, New York 1995

Authors and Affiliations

  • Motohiro Okade
    • 1
  • Kiyofumi Mizuno
    • 1
  • Koichiro Kawashima
    • 2
  1. 1.Aisin Seiki Co., Ltd.KariyaJapan
  2. 2.Nagoya Institute of TechnologyGokiso - cho, Showa - ku, NagoyaJapan

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