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Imaging Deep Micro Defects in Structural Ceramics by Precision C-Scan Technique

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Acoustical Imaging

Part of the book series: Acoustical Imaging ((ACIM,volume 21))

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Abstract

New advanced materials such as structural ceramics exhibit excellent performance, but mostly they are very sensitive to tiny defects. The critical size of defect caused failure of structural ceramics is typically of 10 to 100 micron. And it is needed to detect such micro defects in large depth inside the ceramic components. The precision ultrasonic C-Scan is one of the new nondestructive techniques which could be used to detect micro defects in solids1.

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References

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© 1995 Springer Science+Business Media New York

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Shen, J., Jiang, F., Deng, J., Wang, L. (1995). Imaging Deep Micro Defects in Structural Ceramics by Precision C-Scan Technique. In: Jones, J.P. (eds) Acoustical Imaging. Acoustical Imaging, vol 21. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-1943-0_65

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  • DOI: https://doi.org/10.1007/978-1-4615-1943-0_65

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-5797-1

  • Online ISBN: 978-1-4615-1943-0

  • eBook Packages: Springer Book Archive

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