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X-Ray Spectrometry in Electron Beam Instruments pp 21–31Cite as

Current Trends in Si(Li) Detector Windows for Light Element Analysis

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Abstract

Over the last 10 years much of the progress in x-ray spectroscopy has been in the area of light element analysis. In wavelength dispersive spectroscopy, this has resulted from the development of multilayer synthetic crystals. In energy dispersive spectroscopy, this has resulted from the development of new window technologies. Energy dispersive Si(Li) detectors have become more sensitive over the years, until the window can be the limiting factor in light element x-ray analysis. The window allows x-rays to pass and protects the detector from light and gases. It must withstand atmospheric pressure and repeated pressure cycling. Several technologies have been developed for this purpose.(1,2)

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Author information

Authors and Affiliations

  1. MOXTEK, Inc., Orem, Utah, 84057, USA

    M. W. Lund

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  1. M. W. Lund
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Editors and Affiliations

  1. Lehigh University, Bethlehem, Pennsylvania, USA

    David B. Williams

  2. University of Massachusetts at Amherst, Amherst, Massachusetts, USA

    Joseph I. Goldstein

  3. National Institute of Standards and Technology, Gaithersburg, Maryland, USA

    Dale E. Newbury

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© 1995 Springer Science+Business Media New York

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Lund, M.W. (1995). Current Trends in Si(Li) Detector Windows for Light Element Analysis. In: Williams, D.B., Goldstein, J.I., Newbury, D.E. (eds) X-Ray Spectrometry in Electron Beam Instruments. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-1825-9_3

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  • DOI: https://doi.org/10.1007/978-1-4615-1825-9_3

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-5738-4

  • Online ISBN: 978-1-4615-1825-9

  • eBook Packages: Springer Book Archive

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