Abstract
Emerging chip scale packages (CSPs) and miniature versions of ball grid arrays (BGAs), are competing with bare die flip chip assemblies. CSP is an important miniature electronic package technology utilizing low pin counts, without the attendant handling and processing problems of low peripheral leaded packages such as thin small outline packages (TSOPs) and high-I/O (input/ output) quad flat packages (QFPs). Advantages include self-alignment capability during assembly reflow process and better lead (ball) rigidity. Reliability data and inspection techniques are needed for CSP acceptance especially for high-reliability applications.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
R. Ghaffarian, et al., “CSP Consortia Activities: Program Objectives and Status,” Proceedings of Surface Mount International, Aug. 1998.
K., Kosuga, “CSP (Chip Size Package) Technology for Mobile Apparatus,” International Symposium on Microelectronics, Philadelphia, PA, 1997.
S. Lindsey, S., et al., “JACS-Pak Flip-Chip Scale Package Development and Characterization,” Proceedings of 48th Electronic Components and Technology Conference (ECTC) Proceedings, May 1998.
R. Darveaux, A. Mawer, “Solder Joint Fatigue of F1exBGA,” Proceedings of 48th Electronic Components and Technology Conference (ECTC) Proceedings, May 1998.
K. Ano and T. Ohuchida, T., “Reliability Study of the Chip Scale Package Using Flex Substrate,” Proceedings of the Chip Scale Packaging Symposium, Sept. 1997.
R. Chanchani, et al, “mini Ball Grid Array (mBGA) Assembly on MCM-L Boards,” Proceedings of Electronic Components and Technology Conference, May 1997.
H. Juso, et al., “Board Level Reliability of CSP,” Proceedings of 48th Electronic Components and Technology Conference (ECTC) Proceedings, May 1998.
S. Baba, et al., “Molded Chip Scale Package for High Pin Count,” Proceedings of IEEE Electronic Components and Technology Conference, May 1996.
Presentation- A. Badihi, “Test Results for Reliability of ShellCase CSPs,” IMAPS ATW Workshop on CSP, (Austin, TX), Aug. 1997.
S. Greathouse “Chip Scale Package Solutions-The Pro’s and Cons,” Proceedings of second International Conference on Chip Scale Packaging, CHIPCON ‘97, Feb. 1997.
P. Lall, “Assembly Level Reliability Characterization of Chip-Scale Packages,” Proceed-ings of 48th Electronic Component & Technology Conference, May 1998.
S. Matsuda, K. Kata and E. Hagimoto, “Simple-Structure, Generally Applicable Chip-Scale Package,” Proceeding of IEEE Electronic Components and Technology Conference, May 1995.
T. Oishi, et al., “Strategy for Fine Pitch BGA Development in NEC, and its Applications,” Proceedings of 2nd International Conference on Chip Scale Packaging. CHIPCON ‘97, Feb. 1997.
C. Koehler, et al., “A User-Focused Chip Scale Packaging Solution,” Proceedings of 2nd International Conference on Chip Scale Packaging, CHIPCON ‘97, Feb. 1997.
R. Lanzone, “Ceramic CSP: A Low Cost, Adaptive Interconnect, High Density Technology,” Proceedings of 2nd International Conference on Chip Scale Packaging, CHIP-CON ‘97, Feb. 1997.
J. Kasai, et al., “Low Cost Chip Scale Package for Memory Products,” Proceedings of Surface Mount International, Aug. 1995.
Y. Kim, et al., “Bottom Leaded Plastic (BLP) Package: A New Design with Enhanced Solder Joint Reliability,” Proceedings of IEEE Electronic Components and Technology Conference, May 1996.
Y. Kim, et al., “Solder Joint Reliability of The Leaded and Leadless Packages: New BLP Design,” SEMICON West, July 1997.
K. Hatano, et al., “Reliability of CSP Manufactured by Using LOC Package Technology,” IMAPS ATW Workshop on CSP, (Austin, TX), Aug. 1997.
J. Lau, editor, Solder Joint Reliability Theory and Applications.
P. Viswanadham, et al., “Solder Joint Reliability on TSOPs-An Overview”, Proceedings of IEEE 43rd ECTC, 1993.
K. Newman and M. Yuan, “Board Level Evaluation of Various Chip Scale Packages,” Proceedings of The Technical Conference at Chip Scale International, May 1998.
P. Elenius, private communication.
R. Bauer and J. Malatesta, “Advances in Chip Scale Packaging,” Proceedings of Surface Mount International, Aug. 1998.
R. Ghaffarian, Ball Grid Array Packaging Guidelines, Interconnect Technology Research Institute (ITRI), Aug. 1998, http://www.TRI.org
Author information
Authors and Affiliations
Editor information
Rights and permissions
Copyright information
© 2001 Springer Science+Business Media New York
About this chapter
Cite this chapter
Ghaffarian, R. (2001). Chip Scale Package Assembly Reliability. In: Puttlitz, K.J., Totta, P.A. (eds) Area Array Interconnection Handbook. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-1389-6_23
Download citation
DOI: https://doi.org/10.1007/978-1-4615-1389-6_23
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-5529-8
Online ISBN: 978-1-4615-1389-6
eBook Packages: Springer Book Archive