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In-Situ Chemical Dynamics and Phase Mapping Under Steep Thermal Gradients Using Time-Resolved and Spatially Resolved X-Ray Diffraction

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Properties of Complex Inorganic Solids 2
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Abstract

Time-resolved and spatially-resolved diffraction techniques have been developed recently to perform materials dynamics study in-situ extending into the time and spatial domain in high temperature processes. The applications of these methods to investigate the chemical dynamics of solid combustion reactions and to map phases and their transformation in fusion welds are exemplified in this paper.

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Wong, J., Larson, E.M., Holt, J.B., Ressler, T., Elmer, J.W. (2000). In-Situ Chemical Dynamics and Phase Mapping Under Steep Thermal Gradients Using Time-Resolved and Spatially Resolved X-Ray Diffraction. In: Meike, A., Gonis, A., Turchi, P.E.A., Rajan, K. (eds) Properties of Complex Inorganic Solids 2. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-1205-9_22

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  • DOI: https://doi.org/10.1007/978-1-4615-1205-9_22

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-5440-6

  • Online ISBN: 978-1-4615-1205-9

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