Abstract
This chapter describes an innovative Built-In Self Test architecture based oncellular automata. The architecture is an enhancement of standard Circular Self-Test Path, and increases stuck-at fault coverage while maintaining all advantages, such as low timing intrusiveness, easy integration into design flow, at-speed testing. Cellular automaton rules are devised using the Selfish Gene algorithm, a new evolutionary algorithm based on an unorthodox view of the Darwinian theory, where the basic units of selection are genes rather than individuals. Experimental results show the effectiveness of the approach and the efficacy of the Selfish Gene algorithm.
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Corno, F., Reorda, M.S., Squillero, G. (2003). Built-In Self Test of Sequential Circuits. In: Drechsler, R., Drechsler, N. (eds) Evolutionary Algorithms for Embedded System Design. Genetic Algorithms and Evolutionary Computation, vol 10. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-1035-2_5
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DOI: https://doi.org/10.1007/978-1-4615-1035-2_5
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