Diffraction and Imaging of Ordered Semiconductors

Transmission Electron Microscopy Experiment and Theory
  • S. P. Ahrenkiel


Transmission electron microscope diffraction and imaging of the ordered semiconductors Ga0.51n0.5P, Ga0.5In0.5As, and CuInSe2 are discussed.

Key words

semiconductors ordering transmission electron microscopy 


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. [1]
    L. Reimer, Transmission Electron Microscopy, Springer-Verlag, New York, 1984.Google Scholar
  2. [2]
    J. C. H. Spence, Experimental High-Resolution Electron Microscopy,2nd Ed., Oxford, New York, 1988.Google Scholar
  3. [3]
    S.-J. Kim, H. Asahi, M. Takemoto, K. Asami, M. Takeuchi, and S.-I. Gonda, Jpn. J. Appl. Phys., 33, (1996) 4225.ADSCrossRefGoogle Scholar
  4. [4]
    B. PamplinProg. Crystal Growth Charact., 3, (1981) 179.CrossRefGoogle Scholar
  5. [5]
    S. Francoeur, G. A. Seryogin, S. A. Nikishin, and H. Temkin, Appl. Phys. Letters, 74, (1999) 3678.ADSCrossRefGoogle Scholar
  6. [6]
    A. Rockett and R. W. Birkmire, J. Appl. Phys., 70, (1991) R81.ADSCrossRefGoogle Scholar
  7. [7]
    C. RincOnPhys. Rev. B., 45, (1992) 12716.ADSCrossRefGoogle Scholar
  8. [8]
    M. Hansen and K. Anderko, Constitution of Binary Alloys, McGraw-Hill, New York 1958.Google Scholar
  9. [9]
    C. B. WalkerJ. Appl. Phys., 23, (1952) 118.ADSCrossRefGoogle Scholar
  10. [10]
    A. Gomyo, T. Suzuki, K. Kobayashi, S. Kawata, I. Hino, and T. Yuasa, Appl. Phys. Letters, 50, (1987) 673.ADSCrossRefGoogle Scholar
  11. [11]
    T. Y. Seong, A. G. Norman, G. R. Booker, and A. G. Cullis, J. Appl. Phys., 75, (1994) 12.CrossRefGoogle Scholar
  12. [12]
    Y.-E. Ihm, N. Otsuka, J. Klem, and H. Morkoc, Appl. Phys. Letters, 51, (1987) 2013.ADSCrossRefGoogle Scholar
  13. [13]
    G. S. Chen, D. H. Jaw, and G. B. Stringfellow, J. Appl. Phys., 69, (1991) 4263.ADSCrossRefGoogle Scholar
  14. [14]
    T. Suzuki, T. Ichihashi, and T. Nakayama, Appl. Phys. Letters, 73, (1998) 2588.ADSCrossRefGoogle Scholar
  15. [15]
    S. Froyen and A. Zunger, Phys. Rev. Lett., 66, (1991) 2132.ADSCrossRefGoogle Scholar
  16. [16]
    T. Suzuki and A. Gomyo, J. Crystal Growth, 111, (1991) 353.ADSCrossRefGoogle Scholar
  17. [17]
    B. A. Philips, A. G. Norman, T. Y. Seong, S. Mahajan, G. R. Booker, M. Skowronski, J. P. Harbison, and V. G. Keramidas, J. Crystal Growth, 140, (1994) 249.ADSCrossRefGoogle Scholar
  18. [18]
    C. Meenakam, A. E. Staton-Bevan, M. D. Dawson, G. Duggan, A. H. Kean, and S. P. Najda, Inst. Phys. Conf. Ser., 157, (1997) 265.Google Scholar
  19. [19]
    R. E. Smallman, W. Hume-Rothery, and C. W. Haworth, The Structures of Metals and Alloys,Institute of Metals, London, 1988.Google Scholar
  20. [20]
    T. S. Kuan, T. F. Kuech, W. I. Wang, and E. L. Wilkie, Appl. Phys. Letters, 54, (1985) 201.CrossRefGoogle Scholar
  21. [21]
    O. Ueda, Y. Nakata, T. Nakamura, and T. Fujii, J. Crystal Growth, 115, (1991) 375.ADSCrossRefGoogle Scholar
  22. [22]
    D. S. Su, W. Neumann, R. Hunger, P. Schubert-Bischoff, M. Giersig, H. J. Lewerenz, R. Scheer, and E. Zeitler, Appl. Phys. Letters, 73, (1998) 785.ADSCrossRefGoogle Scholar
  23. [23]
    H. R. Jen, M. J. Cherng, and G. B. Stringfellow, Appl. Phys. Letters, 48, (1986) 1603.ADSCrossRefGoogle Scholar
  24. [24]
    S.-H. Wei, L. G. Ferreira, and A. Zunger, Phys. Rev. B, 41, (1990) 8240.ADSCrossRefGoogle Scholar
  25. [25]
    C. J. Kiely, R. C. Pond, G. Kenshole, and A. Rockett, Phil. Mag. A, 63, (1991) 1249.ADSCrossRefGoogle Scholar
  26. [26]
    J. R. Tuttle, Ph.D. Thesis, University of Colorado (1990).Google Scholar
  27. [27]
    D. J. Arent, M. H. Bode, K. A. Bertness, S. R. Kurtz, and J. M. Olson, Appl. Phys. Letters, 62, (1993) 1806.ADSCrossRefGoogle Scholar
  28. [28]
    E. Morita, M. Ikeda, O. Kumagai, and K. Kaneko, Appl. Phys. Letters, 53, (1988) 2164.ADSCrossRefGoogle Scholar
  29. [29]
    M. Ishimaru, S. Matsumura, N. Kuwano, and K. Oki, Phys. Rev. B, 52, (1995) 5154.ADSCrossRefGoogle Scholar
  30. [30]
    C. S. Baxter, W. M. Stobbs, and J. H. Wilkie, J. Crystal Growth, 112, (1991) 373.ADSCrossRefGoogle Scholar
  31. [31]
    C. S. Baxter and W. M. Stobbs, Phil. Mag. A, 69, (1994) 615.ADSCrossRefGoogle Scholar
  32. [32]
    D. J. Friedman, J. G. Zhu, J. M. Olson, A. E. Kibbler, and J. Moreland, Appl. Phys. Letters, 63, (1993) 1774.ADSCrossRefGoogle Scholar
  33. [33]
    L. C. Su, S. T. Pu, G. B. Stringfellow, J. Christen, H. Selber, and D. Bimberg, J. Electronic Materials, 23, (1994) 125.ADSCrossRefGoogle Scholar
  34. [34]
    D. J. Friedman, G. S. Homer, S. R. Kurtz, K. A. Bertness, J. M. Olson, and J. Moreland, Appl. Phys. Letters, 65, (1994) 878.ADSCrossRefGoogle Scholar
  35. [35]
    H. M. Cheong, A. Mascarenhas, S. P. Ahrenkiel, K. M. Jones, J. F. Geisz, and J. M. Olson, J. Appl. Phys., 89, (1998) 5418.ADSCrossRefGoogle Scholar
  36. [36]
    L. C. Su, I. H. Ho, and G. B. Stringfellow, J. Appl. Phys., 75, (1994) 5135.ADSCrossRefGoogle Scholar
  37. [37]
    L. Nasi, F. Fermi, C. Ferrari, L. Francesio, L. Lazzarini, C. Zanotti-Fregonara, S. Pellegrino, and G. Salviati, Inst. Phys. Conf. Ser., 157, (1997) 269.Google Scholar
  38. [38]
    L. C. Su and G. B. Stringfellow, J. Appl. Phys., 78, (1995) 6775.ADSCrossRefGoogle Scholar
  39. [39]
    S. Takeda, Y. Kuno, N. Hosoi, and K. Shimoyama, J. Crystal Growth, 205, (1999) 11.ADSCrossRefGoogle Scholar
  40. [40]
    W. H. Flannery and, B. P. Flannery, S. A. Teukolsky, W. T. Vetterling, Numerical Recipes, Cambridge, New York, 1986.Google Scholar
  41. [41]
    J. M. Zuo and A. L. Weickenmeier, Ultramicro., 57, (1995) 375.CrossRefGoogle Scholar
  42. [42]
    P. A. Doyle and P. S. Turner, Acta Cryst., A 24 (1968) 390.CrossRefGoogle Scholar
  43. [43]
    G. Radi, Acta Cryst., A 26 (1970) 41.CrossRefGoogle Scholar
  44. [44]
    R. L. Forrest, T. D. Golding, S. C. Moss, Y. Zhang, J. F. Geisz, J. M. Olson, A. Mascarenhas, P. Ernst, and C. Geng, Phys. Rev. B, 58, (1998) 15355.ADSCrossRefGoogle Scholar
  45. [45]
    S. Francoeur, G. A. Seryogin, S. A. Nikishin, and H. Temkin, Appl. Phys. Letters, 76, (1999) 2017.ADSCrossRefGoogle Scholar
  46. [46]
    M. H. Bode, S. P. Ahrenkiel, S. R. Kurtz, K. A. Bertness, D. J. Arent, and J. M. Olson, Mat. Res. Soc. Symp. Proc., 417, (1996) 55.CrossRefGoogle Scholar
  47. [47]
    International Tables for Crystallography, Ed. T. Hahn, Kluwer Academic, Boston, 1996.Google Scholar
  48. [48]
    M. M. Treacy, J. M. Gibson, and A. Howie, Phil. Mag. A, 51, (1985) 389.ADSCrossRefGoogle Scholar
  49. [49]
    J. P. Gowers, Appl. Phys. A, 34, (1984) 231.ADSCrossRefGoogle Scholar
  50. [50]
    L. T. Romano, I. M. Robertson, J. E. Greene, and J. E. Sundgren, Phys. Rev. B, 36, (1987) 7523.ADSCrossRefGoogle Scholar
  51. [51]
    G. Hahn, C. Geng, P. Ernst, H. Schweizer, and F. Scholz, Superlattices and Micro., 22 (1997) 301.ADSCrossRefGoogle Scholar
  52. [52]
    U. Döff, H. Kalt, W. Send, D. Gerthsen, D. J. Mowbray, and C. C. Button, Appl. Phys. Letters, 73, (1998) 1679.ADSCrossRefGoogle Scholar
  53. [53]
    U. Kops, R. G. Ulbrich, M. Burkard, C. Geng, F. Scholz, and M. Schweizer, Phys. Stat. Sol., 164, (1997) 459.ADSCrossRefGoogle Scholar
  54. [54]
    R. M. Fisher and M. J. Marcinkowski, Phil. Mag., 6, (1961) 1385.ADSCrossRefGoogle Scholar
  55. [55]
    P. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, and M. J. Whelan, Electron, Microscopy of Thin Crystals,Krieger, Hungtington, 1977.Google Scholar
  56. [56]
    A. Howie and Z. S. Basinski, Phil. Mag., 17, (1968) 1039.ADSCrossRefGoogle Scholar
  57. [57]
    D.B. Williams and C. B. Carter, Transmission Electron Microscopy: A Textbook for Materials Science, Plenum, New York, 1996.Google Scholar
  58. [58]
    Y. Zhang, A. Mascarenhas, S. P. Ahrenkiel, D. J. Friedman, J. F. Geisz, and J. M. Olson, Solid State Comm., 109, (1999) 99.CrossRefGoogle Scholar
  59. [59]
    D. Munzar, E. Dobrcaa, I. Vavra, R. Kildela, M. Harvanka, and N. E. Christensen, Phys. Rev. B, 57, (1998) 4642.ADSCrossRefGoogle Scholar
  60. [60]
    S.-H. Wei, S. B. Zhang, and A. Zunger, Phys. Rev. B, 59, (1999) R2478.ADSCrossRefGoogle Scholar
  61. [61]
    T. Saβ, I. Pietzonka, and H. Schmidt, J. Appl. Phys., 85, (1999) 3561.ADSCrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 2002

Authors and Affiliations

  • S. P. Ahrenkiel
    • 1
  1. 1.National Renewable Energy LaboratoryGoldenUSA

Personalised recommendations