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Diffraction and Imaging of Ordered Semiconductors

Transmission Electron Microscopy Experiment and Theory
  • S. P. Ahrenkiel

Abstract

Transmission electron microscope diffraction and imaging of the ordered semiconductors Ga0.51n0.5P, Ga0.5In0.5As, and CuInSe2 are discussed.

Key words

semiconductors ordering transmission electron microscopy 

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Copyright information

© Springer Science+Business Media New York 2002

Authors and Affiliations

  • S. P. Ahrenkiel
    • 1
  1. 1.National Renewable Energy LaboratoryGoldenUSA

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