Abstract
The Patterns section defines the operation of the test, by repeated application of Waveforms on each Signal.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 2003 Springer Science+Business Media New York
About this chapter
Cite this chapter
Maston, G.A., Taylor, T.R., Villar, J.N. (2003). Patterns. In: Elements of STIL. Frontiers in Electronic Testing, vol 24. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-0463-4_5
Download citation
DOI: https://doi.org/10.1007/978-1-4615-0463-4_5
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-5089-7
Online ISBN: 978-1-4615-0463-4
eBook Packages: Springer Book Archive