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I Optical and X-ray Examination of Crystals

II Measurement of Intensity Data from Single Crystals

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Structure Determination by X-ray Crystallography
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Abstract

The optical examination of crystals is interesting in its own right. However, in structure determinations with modern equipment, it is not uncommon to proceed immediately with x-ray studies. In many cases, the technique is straightforward, particularly with the single-crystal x-ray diffractometer (Section 4.7), and the desired results are readily obtained. There are other situations though, where complications arise because of an unusual habit (Section 4.3.3), pseudosymmetry (Section 6.4.4) or twinning (Section 4.11). In such cases, it may be possible to extract useful information from an optical examination of a crystal before using the more detailed x-ray methods.

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Ladd, M., Palmer, R. (2003). I Optical and X-ray Examination of Crystals. In: Structure Determination by X-ray Crystallography. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-0101-5_4

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  • DOI: https://doi.org/10.1007/978-1-4615-0101-5_4

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-306-47454-5

  • Online ISBN: 978-1-4615-0101-5

  • eBook Packages: Springer Book Archive

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