Abstract
Testing electronics for vulnerability to radio frequency (RF) radiation is time consuming, due to the large number of source variables of interest, including center frequency, pulse width, pulse repetition frequency, number of pulses, and bandwidth. One must intelligently select the source parameters most likely to expose the greatest vulnerability. We do so here using standard techniques from minimization theory. Within a space of two or more variables, we search for the combination that upsets the system at the lowest power or field level. We investigated the vulnerability of media converters to pulsed RF fields, by pinging a remote computer.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Nitsch, D., Sabath, F., Schmidt, H.-U., Braun, C.: Comparison of the HPM and UWB Susceptibility of Modern Microprocessor Boards. System Design and Assessment Note 36 (July 2002)
Camp, M., Nitsch, D., Sabath, F., ter Haseborg, J.-L., Garbe, H.: Susceptibility of Some Electronic Equipment to HPEM Threats. System Design and Assessment Note 37 (February, 2004)
Farr, E.G., Bowen, L.H., Bigelow, W.S., Gardner, R.L., Finlay, P.: Automated and Adaptive RF Testing. Measurement Note 63 (March 2011)
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2014 Springer Science+Business Media New York
About this paper
Cite this paper
Farr, E.G., Bowen, L.H., Bigelow, W.S., Gardner, R.L., Finlay, P. (2014). Automated and Adaptive RF Effects Testing. In: Sabath, F., Mokole, E. (eds) Ultra-Wideband, Short-Pulse Electromagnetics 10. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-9500-0_36
Download citation
DOI: https://doi.org/10.1007/978-1-4614-9500-0_36
Published:
Publisher Name: Springer, New York, NY
Print ISBN: 978-1-4614-9499-7
Online ISBN: 978-1-4614-9500-0
eBook Packages: Physics and AstronomyPhysics and Astronomy (R0)