Charging and Damage

Chapter
Part of the SpringerBriefs in Materials book series (BRIEFSMATERIALS)

Abstract

A major concern in both scanning electron and scanning ion microscopy is that of sample charging, but strategies to eliminate this problem are available.

Keywords

Helium Assure 

Copyright information

© David Joy 2013

Authors and Affiliations

  1. 1.University of TennesseeKnoxvilleUSA

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