Charging and Damage

Part of the SpringerBriefs in Materials book series (BRIEFSMATERIALS)


A major concern in both scanning electron and scanning ion microscopy is that of sample charging, but strategies to eliminate this problem are available.


Stable Imaging Sample Charge Dwell Period Large Electric Field Specimen Chamber 
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Copyright information

© David Joy 2013

Authors and Affiliations

  1. 1.University of TennesseeKnoxvilleUSA

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