Abstract
Transistor biasing can be used to increase the mismatch between the transistors of PUF cells artificially. This technique is described in this chapter. In the first part the performance of the approach is analyzed analytically. Thus, the error rate after biasing can be estimated. Biasing can be realized utilizing NBTI or HCI which are transistor aging effects. Both approaches, NBTI and HCI utilizing is explained.
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© 2013 Springer Science+Business Media New York
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Böhm, C., Hofer, M. (2013). PUF Biasing. In: Physical Unclonable Functions in Theory and Practice. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-5040-5_11
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DOI: https://doi.org/10.1007/978-1-4614-5040-5_11
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Publisher Name: Springer, New York, NY
Print ISBN: 978-1-4614-5039-9
Online ISBN: 978-1-4614-5040-5
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