Skip to main content

Radiation-Tolerant MASH Delta-Sigma Time-to-Digital Converters

  • Chapter
  • First Online:
Book cover Nyquist AD Converters, Sensor Interfaces, and Robustness

Abstract

Time-to-Digital Converters (TDCs) are key building blocks in time-based mixed-signal systems, used for the digitization of analog signals in time domain. A short survey on state-of-the-art TDCs is given. In order to realize a TDC with picoseconds time resolution as well as multi MGy gamma-dose radiation tolerance, a third-order time-domain ΔΣ TDC structure is proposed. The first prototyping TDC, implemented in 0.13 μm, consumes only 1.7 mW from a 1.2 V supply. It achieves a time resolution of 5.6 ps and an ENOB of 11 bits, when the oversampling ratio (OSR) is 250. The SNDR is mainly limited by the skew error introduced by the comparator delay, which can be mitigated by using a delay-line assisted calibration technique. It improves the ENOB of the TDC to 13 bits and achieves a wide input dynamic range of 100-ns. The TDC also exhibits enhanced radiation tolerance owing to the mismatch-insensitive nature of the ΔΣ structure. Even after a total dose of 3.4 MGy at a high dose rate of 30 kGy/h, the ENOB only drops by 1 bit and, for an OSR of 250, a 10.5 ps time resolution is still achieved.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 129.00
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 169.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 169.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Giraud A (2004) Radiation tolerance assessment of standard electronic components for remote handling. Annual Report of the Association EURATOM-CEA 2004, pp 77–82, available online:http://www-fusion-magnetique.cea.fr/actualites/RA04/eur-cea-technology-2004-full.pdf

  2. Staszewski RB, Vemulapalli S, Vallur P, Wallberg J, Balsara PT (2006) 1.3 V 20 ps time-to-digital converter for frequency synthesis in 90-nm CMOS. IEEE Trans Circ Syst II 53(3):220–224

    Article  Google Scholar 

  3. Dudek P, Szczepanski S, Hatfield JV (2000) A high-resolution CMOS time-to-digital converter utilizing a Vernier delay line. IEEE J Solid-St Circ 35(2):240–247

    Article  Google Scholar 

  4. Yu J, Dai FF, Jaeger RC (2010) A 12-bit Vernier ring time-to-digital converter in 0.13 μm CMOS technology. IEEE J Solid-St Circ 45(4):830–842

    Article  Google Scholar 

  5. Hashimoto T, Yamazaki H, Muramatsu A, Sato T, Inoue A (2008) Time-to-digital converter with Vernier delay mismatch compensation for high resolution on-die clock jitter measurement. In: IEEE symposium on VLSI circuits, Digest of technical papers, pp 166–167, June 2008 Honolulu, Hawaii USA

    Google Scholar 

  6. Lee M, Abidi AA (2008) A 9b, 1.25 ps resolution coarse-fine time-to-digital converter in 90 nm CMOS that amplifies a time residue. IEEE J Solid-St Circ 43(4):769–777

    Article  Google Scholar 

  7. Seo YH, Kim JS, Park HJ, Sim JY (2011) A 0.63 ps resolution, 11b pipeline TDC in 0.13 μm CMOS. In: IEEE symposium on VLSI circuits, Digest of technical papers, pp 152–153, June 2011 Kyoto, Japan

    Google Scholar 

  8. Jansson JP, Mantyniemi A, Kostamovaara J (2006) A CMOS time-to-digital converter with better than 10 ps single-shot precision. IEEE J Solid-St Circ 41(6):1286–1296

    Article  Google Scholar 

  9. Henzler S, Koeppe S, Kamp W, Mulatz H, Schmitt-Landsiedel D (2008) 90 nm 4.7 ps-resolution 0.7-LSB single-shot precision and 19pJ-per-shot local passive interpolation time-to-digital converter with on-chip characterization. In: IEEE international solid state circuits conference, Digest of technical papers, pp 548–549, Feb 2008 San Francisco, CA, USA

    Google Scholar 

  10. Mäntyniemi A, Rahkonen T, Kostamovaara J (2009) A CMOS time-to-digital converter (TDC) based on a cyclic time domain successive approximation interpolation method. IEEE J Solid-St Circ 44(11):3067–3078

    Article  Google Scholar 

  11. van Vroonhoven CPL, Makinwa KAA (2008) A CMOS temperature-to-digital converter with an inaccuracy of ±0.5 °C (3σ) from −55 to 125 °C. In: IEEE international solid state circuits conference, Digest of technical papers, pp 576–577, Feb 2008 San Francisco, CA, USA

    Google Scholar 

  12. Young B, Kwon S, Elshazly A, Hanumolu PK (2010) A 2.4 ps resolution 2.1 mW second-order noise-shaped time-to-digital converter with 3.2 ns range in 1 MHz bandwidth. In: Proceedings of IEEE custom integrated circuit conference, Sept 2010 San Jose, CA, USA

    Google Scholar 

  13. Ruotsalainen ER, Rahkonen T, Kostamovaara J (2000) An integrated time-to-digital converter with 30-ps single-shot precision. IEEE J Solid-St Circ 35(10):1507–1510

    Article  Google Scholar 

  14. Swann BK, Blalock BJ, Clonts LG et al (2004) A 100-ps time-resolution CMOS time-to-digital converter for positron emission tomography imaging applications. IEEE J Solid-St Circ 39(11):1839–1852

    Article  Google Scholar 

  15. Straayer MZ, Perrott MH (2009) A multi-path gated ring oscillator TDC with first-order noise shaping. IEEE J Solid-St Circ 44(4):1089–1098

    Article  Google Scholar 

  16. Cao Y, Leroux P, De Cock W, Steyaert M (2011) A 1.7 mW 11b 1-1-1 MASH ΔΣ time-to-digital converter. In: IEEE international solid state circuits conference, Digest of technical papers, pp 480–481, Feb 2011 San Francisco, CA, USA

    Google Scholar 

  17. Norsworthy SR, Schreier R, Temes GC (1997) Delta-sigma data converters: theory, design, and simulation, IEEE Press New York, USA

    Google Scholar 

  18. Abidi AA, Meyer RG (1983) Noise in relaxation oscillators. IEEE J Solid-St Circ 18(6):794–802

    Article  Google Scholar 

  19. Cao Y, Leroux P, De Cock W, Steyaert M (2011) A 0.7 mW 13b temperature-stable MASH ΔΣ TDC with delay-line assisted calibration. In: Proceedings of IEEE Asian solid-state circuits conference (A-SSCC), Jeju, pp 361–364

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Ying Cao .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2013 Springer Science+Business Media New York

About this chapter

Cite this chapter

Cao, Y., Leroux, P., De Cock, W., Steyaert, M. (2013). Radiation-Tolerant MASH Delta-Sigma Time-to-Digital Converters. In: van Roermund, A., Baschirotto, A., Steyaert, M. (eds) Nyquist AD Converters, Sensor Interfaces, and Robustness. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-4587-6_12

Download citation

  • DOI: https://doi.org/10.1007/978-1-4614-4587-6_12

  • Published:

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4614-4586-9

  • Online ISBN: 978-1-4614-4587-6

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics