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Reliability Testing of Semiconductor Optical Devices

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Materials and Reliability Handbook for Semiconductor Optical and Electron Devices

Abstract

Reliability of semiconductor optical devices used in recent systems and equipment is described from an aspect of the degradation mechanisms observed on various reliability tests. The degradation mechanisms clarified for last three decades still govern the device reliability in recent systems and equipment. The reliability of optical devices is limited with the change rate of the device characteristics in systems and equipment, and the rate is governed by the degradation mechanisms. The correlations between degradation mechanisms and the change rates of device characteristics are also reviewed and discussed in this chapter.

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References

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Author information

Authors and Affiliations

  1. Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology, 1-1, Hibarigaoka, Tempaku, Toyohashi, Aichi, 441-8580, Japan

    Mitsuo Fukuda

Authors
  1. Mitsuo Fukuda
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Correspondence to Mitsuo Fukuda .

Editor information

Editors and Affiliations

  1. Graduate School of Engineering, Kanazawa Institute of Technology, Tokyo, Japan

    Osamu Ueda

  2. Materials Science and Engineering, University of Florida, Gainesville, Florida, USA

    Stephen J. Pearton

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Fukuda, M. (2013). Reliability Testing of Semiconductor Optical Devices. In: Ueda, O., Pearton, S. (eds) Materials and Reliability Handbook for Semiconductor Optical and Electron Devices. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-4337-7_1

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  • DOI: https://doi.org/10.1007/978-1-4614-4337-7_1

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  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4614-4336-0

  • Online ISBN: 978-1-4614-4337-7

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