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Opto-Acoustic Technique to Evaluate Adhesion Strength of Nano-Scale Systems

  • Sanichiro Yoshida
  • Kenji Gomi
  • Sushovit Adhikari
  • Patrick F. Flowers
  • Katelyn Dreux
Conference paper
Part of the Conference Proceedings of the Society for Experimental Mechanics Series book series (CPSEMS)

Abstract

An opto-acoustic technique to evaluate the adhesion strength of thin film systems at the film-substrate interface is discussed. The strongly and weakly adhered film specimens are configured as the end-mirrors of a Michelson interferometer, and driven from the rear with an acoustic transducer at audible frequencies. The amplitude of the resultant oscillation of the film is quantified as the variation in the contrast of the interferometric fringe pattern observed with a digital camera at 30 frames/s. The technique successfully differentiates the adhesion strength of the specimens. Fourier analysis in the spatial frequency domain enables us to estimate the oscillation amplitude of the thin film in nanometers as a function of driving frequency.

Keywords

Adhesion Strength Oscillation Amplitude Fringe Pattern Michelson Interferometer Driving Frequency 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgement

The authors are grateful to Mark Horn of the Pennsylvania State University for helpful discussions regarding the science of thin-film coating. This study has been supported in part by the National Science Foundation International Research Experience for Student Grant (IRES-0927033) awarded to Southeastern Louisiana University, the Tokyo Denki University internal research grant and the National Research Foundation of Korea (grant No. 2011–001790).

References

  1. 1.
    Atlar A, Quate CF, Wickramasinghe HK (1977) Phase imaging in reflection with the acoustic microscope. Appl Phys Lett 31:791–793CrossRefGoogle Scholar
  2. 2.
    Telschow KL, Deason VA, Cottle DL, Larson JD III (2003) Full-field imaging of gigahertz film bulk acoustic resonator motion. IEEE Trans Ultrason 50:1279–1285CrossRefGoogle Scholar

Copyright information

© The Society for Experimental Mechanics, Inc. 2013

Authors and Affiliations

  • Sanichiro Yoshida
    • 1
  • Kenji Gomi
    • 2
  • Sushovit Adhikari
    • 1
  • Patrick F. Flowers
    • 1
  • Katelyn Dreux
    • 1
  1. 1.Department of Chemistry and PhysicsSoutheastern Louisiana UniversityHammondUSA
  2. 2.Department of Mechanical EngineeringTokyo Denki UniversityTokyoJapan

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