Abstract
The minimum supply voltage for SRAM cell is limited by write failures (write-ability) or read disturb failures (cell stability). In the previous chapter, various SRAM cells are discussed which offer better variability resilience compared to the SRAM 6T cell and enable low VDD operation. SRAM 6T cell functionality is highly dependent on the supply voltage. The voltage optimization can impact the write failures and the read disturb failures significantly. In this chapter, dynamic voltage optimization techniques, are studied for realizing low VDD operation with the conventional SRAM 6T cell while maintaining sufficient READ/WRITE margins.
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Sharma, V., Catthoor, F., Dehaene, W. (2013). Adaptive Voltage Optimization Techniques: Low Voltage SRAM Operation. In: SRAM Design for Wireless Sensor Networks. Analog Circuits and Signal Processing. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-4039-0_3
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DOI: https://doi.org/10.1007/978-1-4614-4039-0_3
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