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Development of GUI Based Test and Measurement Facilities for Studying Properties of MOS Devices in Clean Room Environment

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Book cover Innovations and Advances in Computer, Information, Systems Sciences, and Engineering

Part of the book series: Lecture Notes in Electrical Engineering ((LNEE,volume 152))

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Abstract

This article describes a Graphics User Interface (GUI), meant for setting up an integrated Test and Measurement (T&M) facility, to study different electrical properties of Metal Oxide Semiconductor (MOS) devices is designed using Matlab 7.5.0 (R2007b). While developing the GUI, a probe station, connected to a Keithley Switch Matrix, and two other instruments namely, a Keithley Semiconductor Parameter Analyzer (SPA) and an Agilent manufactured Inductance-(L) Capacitance-(C) Resistance-(R) (LCR) Bridge, also connected to the switch matrix are considered. All the instruments are controlled over General Purpose Interface Bus (GPIB) protocol through a controller PC.

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Acknowledgments

Authors wish to acknowledge Subhajit Karmakar for their continuous inspiration and extending help in learning Matlab 7.5.0 (R2007b) and GPIB protocol.

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Authors and Affiliations

  1. Applied Nuclear Physics Division, Saha Institute of Nuclear Physics, Kolkata, 700064, INDIA

    Shaibal Saha

  2. Saha Institute of Nuclear Physics, Kolkata, 700064, INDIA

    Supratic Chakraborty

Authors
  1. Shaibal Saha
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  2. Supratic Chakraborty
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Corresponding author

Correspondence to Shaibal Saha .

Editor information

Editors and Affiliations

  1. School of Engineering, University of Bridgeport, University Avenue 221, Bridgeport, 06604, Connecticut, USA

    Khaled Elleithy

  2. School of Engineering, University of Bridgeport, University Avenue 221, Bridgeport, 06604, Connecticut, USA

    Tarek Sobh

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Saha, S., Chakraborty, S. (2013). Development of GUI Based Test and Measurement Facilities for Studying Properties of MOS Devices in Clean Room Environment. In: Elleithy, K., Sobh, T. (eds) Innovations and Advances in Computer, Information, Systems Sciences, and Engineering. Lecture Notes in Electrical Engineering, vol 152. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-3535-8_50

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  • DOI: https://doi.org/10.1007/978-1-4614-3535-8_50

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  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4614-3534-1

  • Online ISBN: 978-1-4614-3535-8

  • eBook Packages: EngineeringEngineering (R0)

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