Abstract
Measuring the time interval between two events requires the choice of a repetitive and regular phenomenon, such as the oscillation of a pendulum, and then counting how many times this phenomenon takes place between the two events. The science of timekeeping has evolved through the centuries by basically adopting more and more precise and reliable periodic phenomena to keep track of time. From the first attempts using evident astronomical events, such as the motion of the sun and the moon, chronometry evolved by employing periodic phenomena in man-made devices, such as sand motion in hourglasses, oscillations in pendulums, balance wheel rotations in mechanical clocks, electromechanical vibrations in quartz crystal oscillators and absorption or emission of radiations in atomic clocks.
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Notes
- 1.
x(t) is obtained using the Fourier series expansion of m(t), i.e. \(A(t) = S(t)\sqrt{{a}_{1 }^{2 } + {b}_{1 }^{2}}\), \(\phi (t) + \theta (t) = 2\pi {f}_{0}\epsilon (t) +\arcsin \frac{{a}_{1}} {\sqrt{{a}_{1 }^{2 }+{b}_{1 }^{2}}}\), where \({a}_{1} = \frac{2} {T}{\int \nolimits \nolimits }_{0}^{{T}_{0}}m(t)\cos (2\pi {f}_{0}t)\,\textrm{ d}t\), \({b}_{1} = \frac{2} {T}{\int \nolimits \nolimits }_{0}^{{T}_{0}}m(t)\sin (2\pi {f}_{0}t)\,\textrm{ d}t\).
- 2.
Note that phase noise can in general also not be a stationary process, since its statistical property changes with time, such as, for example, its variance that can increase with time. The relation between its standard deviation and its PSD is then not well defined. However, defining jitter as a stationary process with parameter Ï„ justifies the calculations presented in this section, even if not all of them are not formally correct, including the integration of S Ï•(f) to compute the jitter.
- 3.
It can be proven, integrating by parts, that \({\int \nolimits \nolimits }_{0}^{+\infty }\frac{{\sin }^{2}x} {{x}^{2}} \textrm{ d}x ={ \int \nolimits \nolimits }_{0}^{+\infty }\frac{\sin x} {x}\textrm{ d}x\); the latter term can be proven to be equal to π ∕ 2 [7].
- 4.
The linearity of passive components describes the variation of the component properties, i.e. resistance or capacitance, for a change in the voltage applied to the component. A high linearity is sign of robustness to voltage variation and consequently low sensitivity to supply voltage variations.
- 5.
- 6.
This condition can be fulfilled by simply embedding in the oscillator tank all reactive components of the active circuit, such as the parasitic capacitances.
- 7.
In order to fulfill this condition, the parasitic capacitances introduced by the active circuit must be minimized; those parasitic can be due to junction capacitances and MOS capacitances, which have different temperature coefficient than the tank capacitor and consequently can not be trimmed out by a temperature compensation.
- 8.
A more efficient circuit could be employed by adding a cross-coupled pMOS pair in parallel with the tank and re-using the same bias current of the nMOS pair. This would result in a factor 2 for the lower bound for the bias current but it would not radically change the conclusions.
- 9.
State-of-the-art CMOS temperature sensors can achieve an inaccuracy of the order of 0.1 ∘ C, as shown in [39] and as will be further discussed in Chap. 5.
References
Jespersen J, Fitz-Randolph J (1977) From sundials to atomic clocks: understanding time and frequency. Dover Publications, Inc., New York
Lee TH (2008) It’s about time: a brief chronology of chronometry. IEEE Solid State Circ, 13(3):42–49
IEEE (1999) IEEE standard definitions of physical quantities for fundamental frequency and time metrology – random instabilities, Std. 1139–1999
Razavi B (1998) RF microelectronics. Prentice-Hall, NJ
ITU-T (1997) Definitions and terminology for synchronization networks, Std. G810
Gierkink SL (1999) Control linearuty and jitter of relaxation oscillators. PhD thesis, University of Twente, http://icd.el.utwente.nl/research/index.php?id=12
Courant R, John F (1965) Introduction to calculus and analysis, vol 1. Wiley, NJ, pp 589–591
Demir A (2006) Computing timing jitter from phase noise spectra for oscillators and phase-locked loops with white and 1/f noise. IEEE Trans Circ Syst I 53(9):1869–1884. DOI 10.1109/TCSI.2006.881184
Liu C, McNeill J (2004) Jitter in oscillators with 1/f noise sources. Proc ISCAS 1:I–773–6. DOI 10.1109/ISCAS.2004.1328309
Gray PR, Hurst PJ, Lewis SH, Meyer RG (2001) Analysis and design of analog integrated circuits, 4th edn. Wiley, NJ
Hastings A (2005) The art of analog layout. Prentice Hall, NJ
Ueda N, Nishiyama E, Aota H, Watanabe H (2009) Evaluation of packaging-induced performance change for small-scale analog IC. IEEE Trans Semicond Manuf 22(1):103–109. DOI 10.1109/TSM.2008.2010739
Abesingha B, Rincon-Mora G, Briggs D (2002) Voltage shift in plastic-packaged bandgap references. IEEE Trans Circ Syst I 49(10):681–685. DOI 10.1109/TCSII. 2002.806734
Ali H (1997) Stress-induced parametric shift in plastic packaged devices. IEEE Trans Comp Packag Manuf Technol B 20(4):458–462
De Smedt V, De Wit P, Vereecken W, Steyaert M (2009) A 66 μW 86 ppm/ ∘ C fully-integrated 6 MHz wienbridge oscillator with a 172 dB phase noise FOM. IEEE J Solid State Circ 44(7):1990–2001. DOI 10.1109/JSSC.2009.2021914
Lee J, Cho S (2009) A 10MHz 80μW 67 ppm/ ∘ C CMOS reference clock oscillator with a temperature compensated feedback loop in 0.18μm CMOS. In: 2009 Symposium on VLSI Circuits Dig. Tech. Papers, pp 226–227
Ueno K, Asai T, Amemiya Y (2009) A 10MHz 80μW 67 ppm/ ∘ C CMOS reference clock oscillator with a temperature compensated feedback loop in 0.18μm CMOS. In: Proc. ESSCIRC, pp 226–227
Pertijs MA, Huijsing JH (2006) Precision temperature sensors in CMOS technology. Springer, Dordrecht
Lane WA, TWrixon G (1989) The design of thin-film polysilicon resistors for analog IC applications. IEEE Trans Electron Dev 36(4):738–744. DOI 10.1109/16.22479
Lampard D (1957) A new theorem in electrostatics with applications to calculable standards of capacitance. Proc IEE C Monogr 104(6):271–280. DOI 10.1049/pi-c.1957. 0032
Thompson A (1959) The cylindrical cross-capacitor as a calculable standard. Proc IEE B Electron Comm Eng 106(27):307–310. DOI 10.1049/pi-b-2.1959.0262
McCreary J (1981) Matching properties, and voltage and temperature dependence of mos capacitors. IEEE J Solid State Circ 16(6):608–616
St Onge S, Franz S, Puttlitz A, Kalinoski A, Johnson B, El-Kareh B (1992) Design of precision capacitors for analog applications. IEEE Trans Comp Hybrids Manuf Technol 15(6): 1064–1071. DOI 10.1109/33.206932
Svelto F, Erratico P, Manzini S, Castello R (1999) A metal-oxide-semiconductor varactor. IEEE Electron Dev Lett 20(4):164–166. DOI 10.1109/55.753754
Chen KM, Huang GW, Wang SC, Yeh WK, Fang YK, Yang FL (2004) Characterization and modeling of SOI varactors at various temperatures. IEEE Trans Electron Dev 51(3):427–433. DOI 10.1109/TED.2003.822585
Sedra AS, Smith KC (1998) Microelectronics circuits, 4th edn. Oxford University Press, New York
Navid R, Lee T, Dutton R (2005) Minimum achievable phase noise of RC oscillators. IEEE J Solid State Circ 40(3):630–637. DOI 10.1109/JSSC.2005.843591
Tokunaga Y, Sakiyama S, Matsumoto A, Dosho S (2010) An on-chip CMOS relaxation oscillator with voltage averaging feedback. IEEE J Solid State Circ 45(6):1150–1158
McCorquodale MS, O’Day JD, Pernia SM, Carichner GA, Kubba S, Brown RB (2007) A monolithic and self-referenced RF LC clock generator compliant with USB 2.0. IEEE J Solid State Circ 42(2):385–399. DOI 10.1109/JSSC.2006.883337
McCorquodale MS, Pernia SM, O’Day JD, Carichner G, Marsman E, Nguyen N, Kubba S, Nguyen S, Kuhn J, Brown RB (2008) A 0.5-to-480 MHz self-referenced CMOS clock generator with 90 ppm total frequency error and spread-spectrum capability. In: ISSCC Dig. of Tech. Papers, pp 524–525
McCorquodale M, Carichner G, O’Day J, Pernia S, Kubba S, Marsman E, Kuhn J, Brown R (2009) A 25-MHz self-referenced solid-state frequency source suitable for XO-replacement. IEEE Trans Circ Syst I 56(5):943–956. DOI 10.1109/TCSI.2009. 2016133
McCorquodale M, Gupta B, Armstrong W, Beaudouin R, Carichner G, Chaudhari P, Fayyaz N, Gaskin N, Kuhn J, Linebarger D, Marsman E, O’Day J, Pernia S, Senderowicz D (2010) A silicon die as a frequency source. In: IEEE International Frequency Control Symp., pp 103–108. DOI 10.1109/FREQ.2010.5556366
Groszkowski J (1964) Frequency of self-oscillations. Pergamon Press, Oxford
Groves R, Harame DL, Jadus D (1997) Temperature dependence of Q and inductance in spiral inductors fabricated in a silicon-germanium/BiCMOS technology. IEEE J Solid State Circ 32(9):1455–1459
Pouydebasque A, Charbuillet C, Gwoziecki R, Skotnicki T (2007) Refinement of the subthreshold slope modelling for advanced bulk CMOS devices. IEEE Trans Electron Dev 54(10):2723–2729
Lee TH (2004) The design of CMOS Radio-frequency integrated circuits, 2nd edn. Cambridge University Press, Cambridge
Makinwa K, Snoeij M (2006) A CMOS temperature-to-frequency converter with inaccuracy of less than 0.5 ∘ C (3σ) from − 40 ∘ C to 105 ∘ C. IEEE J Solid State Circ 41(12):2992–2997
Kashmiri SM, Pertijs MAP, Makinwa KAA (2010) A thermal-diffusivity-based frequency reference in standard CMOS with an absolute inaccuracy of ± 0. 1% from − 55 ∘ C to 125 ∘ C. IEEE J Solid State Circ 45(12):2510–2520
Makinwa KAA (2010) Smart temperature sensors in standard CMOS. In: Proc. Eurosensors XXIV, pp 930–939
van Vroonhoven C, d’Aquino D, Makinwa K (2010) A thermal-diffusivity-based temperature sensor with an untrimmed inaccuracy of ± 0.2 ∘ C (3σ) from − 55 ∘ C to 125 ∘ C. In: ISSCC Dig. of Tech. Papers, pp 314–315. DOI 10.1109/ISSCC.2010.5433900
Kashmiri S, Xia S, Makinwa K (2009) A temperature-to-digital converter based on an optimized electrothermal filter. IEEE J Solid State Circ 44(7):2026–2035. DOI 10.1109/JSSC.2009.2020248
Kashmiri SM, Souri K, Makinwa KAA (2011) A scaled thermal-diffusivity-based frequency reference in 0.16μm CMOS. In: Proc. ESSCIRC, pp 503–506
Kashmiri SM, Pertijs MAP, Makinwa KAA (2010) A thermal-diffusivity-based frequency reference in standard CMOS with an absolute inaccuracy of ± 0. 1% from − 55 ∘ C to 125 ∘ C. In: ISSCC Dig. of Tech. Papers, pp 74–75
Sundaresan K, Allen P, Ayazi F (2006) Process and temperature compensation in a 7-MHz CMOS clock oscillator. IEEE J Solid State Circ 41(2):433–442
Paavola M, Laiho M, Saukoski M, Halonen K (2006) A 3 μW, 2 MHz CMOS frequency reference for capacitive sensor applications. In: Proc. ISCAS, pp 4391–4394
Ge G, Zhang C, Hoogzaad G, Makinwa K (2010) A single-trim CMOS bandgap reference with a 3σ inaccuracy of ± 0.15% from − 40 ∘ C to 125 ∘ C. In: ISSCC Dig. of Tech. Papers, pp 78–79. DOI 10.1109/ISSCC.2010.5434040
Blauschild R (1994) An integrated time reference. ISSCC Dig. of Tech. Papers, pp 56–57
Jiang CL (1988) Temperature compensated monolithic delay circuit, US Patent 4843265
Tsividis Y (2003) Operation and modeling of the MOS transistor, 2nd edn. Oxford University Press, New York
Nguyen CC (2007) MEMS technology for timing and frequency control. IEEE Trans Ultrason Ferroelect Freq Contr 54(2):251–270. DOI 10.1109/TUFFC.2007.240
Ruffieux D, Krummenacher F, Pezous A, Spinola-Durante G (2010) Silicon resonator based 3.2 μW real time clock with 10 ppm frequency accuracy. IEEE J Solid State Circ 45(1):224–234. DOI 10.1109/JSSC.2009.2034434
Perrott M, Pamarti S, Hoffman E, Lee F, Mukherjee S, Lee C, Tsinker V, Perumal S, Soto B, Arumugam N, Garlepp B (2010) A low area, switched-resistor based fractional-n synthesizer applied to a MEMS-based programmable oscillator. IEEE J Solid State Circ 45(12):2566–2581. DOI 10.1109/JSSC.2010.2076570
SiTime Corporation (2009) SiT8003XT datasheet, Sunnyvale, CA. http://www.sitime.com. Accessed 23 Aug 2009
Discera Inc. (2009) DSC1018 datasheet, San Jose, CA. http://www.discera.com. Accessed 23 Aug 2009
Shyu YS, Wu JC (1999) A process and temperature compensated ring oscillator. In: Proc. Asia-Pacific Conference on ASICs, pp 283–286
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Sebastiano, F., Breems, L.J., Makinwa, K.A.A. (2013). Fully Integrated Time References. In: Mobility-based Time References for Wireless Sensor Networks. Analog Circuits and Signal Processing. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-3483-2_3
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