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Atom Probe Microscopy pp 29–68Cite as

From Field Desorption Microscopy to Atom Probe Tomography

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Part of the book series: Springer Series in Materials Science ((SSMATERIALS,volume 160))

Abstract

As mentioned in Chap. 1, atom probe tomography (APT) exploits the principle of field evaporation to successively remove those atoms at the apex of a needle-shaped specimen. Field evaporation involves the ionisation of these surface atoms, whereupon they are subjected to an electric field force that causes them to accelerate towards a detector under a particular projection. The evaporation event follows immediately after the ionisation of the surface atoms, and this ionisation is induced by the combined effects of a standing (DC) electrostatic field and either high-voltage or laser pulses transmitted to the surface atoms of the specimen. The first technique that exploited this process was field desorption microscopy (FDM), which subsequently evolved into the modern atom probe. A general summary of field evaporation theory is first presented, before a more detailed description of FDM and APT and the specific pulsing techniques.

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Authors and Affiliations

  1. Department of Materials Science and Engineering, McMaster University, Hamilton, ON, Canada

    Baptiste Gault

  2. Department of Materials, University of Oxford, Oxford, Oxon, UK

    Michael P. Moody

  3. Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, NSW, Australia

    Julie M. Cairney & Simon P. Ringer

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  1. Baptiste Gault
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  2. Michael P. Moody
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  3. Julie M. Cairney
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  4. Simon P. Ringer
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Gault, B., Moody, M.P., Cairney, J.M., Ringer, S.P. (2012). From Field Desorption Microscopy to Atom Probe Tomography. In: Atom Probe Microscopy. Springer Series in Materials Science, vol 160. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-3436-8_3

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