Abstract
Atom probe microscopy (APM) is a term that encompasses the various imaging and microanalysis techniques that derive from field ionisation, field emission and field evaporation. Amongst other things, APM provides three-dimensional (3D) analytical mapping of materials with atomic-scale resolution and so offers unique insights into both the chemical composition and atomic structure of matter. Although APM techniques were once considered a niche area of high-field physics and surface science, their development has resulted in a powerful microscope that is now an established method for materials characterisation at the atomic scale. Today, APM is recognised as a burgeoning, mainstream microscopy technique, evidenced by a dramatic recent increase in the number of academic and industrial laboratories worldwide that now have APM capabilities.
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Gault, B., Moody, M.P., Cairney, J.M., Ringer, S.P. (2012). Introduction. In: Atom Probe Microscopy. Springer Series in Materials Science, vol 160. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-3436-8_1
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DOI: https://doi.org/10.1007/978-1-4614-3436-8_1
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