Abstract
Lumen depreciation is one of the major failure modes in light-emitting diode (LED) systems. It originated from the degradation of the different components within the package, being the LED device or chip, the driver, and the optical materials (including phosphorous layer). This chapter describes the state of the art of the degradation mechanism for these components and how they contribute to the lumen depreciation of the LED package as a whole.
Keywords
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
International Energy Agency (2006) Light’s labours lost—fact sheet. http://www.iea.org/textbase/nppdf/free/2006/light_fact.pdf
Alliance for Solid-State Illumination Systems and Technologies (ASSIST) (2007) Recommendations for testing and evaluating luminaires used in directional lighting (cited 2nd Feb 2010). http://www.lrc.rpi.edu/programs/solidstate/assist/pdf/directional3.pdf
Mottier P (2009) LEDs for lighting applications. ISTE, Great Britain
US Department of Energy (2009) LED applications. http://www.ssl.energy.gov
Yole Development Report (2009) HB led & led packaging 2009
Nakamura S, Senoh M, Mukai T (1993) P-GaN/N-InGaN/N-GaN double-heterostructure blue-light-emitting diodes. Jap J Appl Phys: Part 2 Lett 32:8
Petroski J (2002) Thermal challenges facing new generation Light Emitting Diodes (LEDs) for lighting applications. Solid State Light II 4776:215–222
“LED” (2005) The American heritage science dictionary. Houghton Mifflin Company. http://dictionary.reference.com/browse/led and http://www.thefreedictionary.com/LED. Accessed 22 Jun 2011
DOE (2009) U.S. LED measurement series: LED luminaire reliability (cited 28 Jan 2010). http://apps1.eere.energy.gov/buildings/publications/pdfs/ssl/luminaire_reliability.pdf
Ye H, Zhang G (2011) A review of passive thermal management of LED module. J Semicond 32:014008
Philips Lighting. Fortimo LED DLM system. http://www.lighting.philips.co.uk
Archenhold G (2009) Driving responsibly, in Mondo arc. Mondiale Publishing Ltd., United Kingdom, pp 93–94
Lahyani A et al (1998) Failure prediction of electrolytic capacitors during operation of a switchmode power supply. IEEE Trans Power Electron 13(6):1199–1207
Malik R et al (2005) Why do power supplies fail, and what can be done about it. IBM
Gasperi ML (1996) Life prediction model for aluminum electrolytic capacitors. Industry Applications Conference, 1996. Thirty-First IAS Annual Meeting, IAS '96, 3:1347–1351
Han L, Narendran N (2009) Developing an accelerated life test method for LED drivers. Ninth International conference on solid state lighting, august 3–5 2009, San Diego, Proceeding of SPIE 7422:742209, p 78–86
The University of Bolton. Electrolytic capacitors. http://www.ami.ac.uk/courses/topics/0136_ec/index.html
Panasonic, Reliability of aluminum electrolytic capacitors, http://industrial.panasonic.com/www-data/pdf/ABA0000/ABA0000TE4.pdf
Down JL (1986) The yellowing of epoxy resin adhesives: report on high-intensity light aging. Stud Conserv 31:159–170
Down JL (1984) The yellowing of epoxy resin adhesives: report on natural dark aging. Stud Conserv 29(2):63–76
Gesner BD, Kelleher PG (1968) Thermal and photo-oxidation of polysulfone. J Appl Polym Sci 12(5):1199–1208
Akhavan J et al (2001) Effect of UV and thermal radiation on polyNIMMO. Polymer 42(18):7711–7718
Huang JC et al (2004) Comparison of epoxy resins for applications in light-emitting diodes. Adv Polym Technol 23(4):298–306
Ollier-Dureault V, Gosse B (1998) Photooxidation of anhydride-cured epoxies: FTIR study of the modifications of the chemical structure. J Appl Polym Sci 70(6):1221–1237
Thompson T, Klemchuk P (1993) Light stabilization of bisphenol A polycarbonate. Polymer durability: degradation, stabilization, and lifetime prediction, American Chemical Society, Washington DC, 1996 303–317
Anderson J, Reese C (1960) Proceedings of the Chemical Society, London. Photo-induced Fries rearrangements, 217
Diepens M (2009) Photodegradation and stability of bisphenol A polycarbonate in weathering conditions. Polymer Degradation and Performance, ACS Symposium Series 1004:287–306
Andrady Norma D, Anthony L (1992) Wavelength sensitivity of unstabilized and UV stabilized polycarbonate to solar simulated radiation. Polym Degrad Stab 35:235–247
Gupta A, Rembaum A, Moacanin J (1978) Solid state photochemistry of polycarbonates. Macromolecules 11(6):1285–1288
Factor A, Ligon WV, May RJ (1987) The role of oxygen in the photoaging of bisphenol A polycarbonate. 2. GC/GC/high-resolution MS analysis of Florida-weathered polycarbonate. Macromolecules 20(10):2461–2468
Munro HS, Allaker RS (1985) Wavelength dependence of the surface photo-oxidation of bisphenol A polycarbonate. Polym Degrad Stab 11:349–358
Lemaire J et al (1986) Dual photo-chemistries in aliphatic polyamides, bisphenol A polycarbonate and aromatic polyurethanes—a short review. Polym Degrad Stab 15(1):1–13
Kameshwar Yadavalli. Solid state lighting. http://www.nd.edu/~gsnider/EE698A/Kameshwar_Light-emitting-diodes.ppt
OIDA (2001) Light Emitting Diodes (LEDs) for general illumination. http://lighting.sandia.gov/lightingdocs/JonesEDLEDRoadmap200103.pdf
Kawakami Y, Funato M (2008) Light-emitting diode design allows precise control of colors and intensity, 29 April 2008, SPIE Newsroom. doi:10.1117/2.1200804.1109
Shao Q et al (2012) Temperature-dependent photoluminescence properties of (Y, Lu)3Al5O12:Ce3+ phosphors for white LEDs applications. J Lumin (in press)
Chiang C-C, Tsai M-S, Hon M-H (2008) Luminescent properties of cerium-activated garnet series phosphor: structure and temperature effects. J Electrochem Soc 155(6):B517–B520
Coetsee E, Terblans JJ, Swart HC (2007) Degradation of Y2SiO5:Ce phosphor powders. J Lumin 126(1):37–42
Swart HC, Hillie KT (2000) Degradation of ZnS FED phosphors. Surf Interface Anal 30(1):383–386
Tan CM et al (2008) Humidity effect on the degradation of packaged ultra-bright white LEDs. In: 10th electronics packaging technology conference (EPTC) 2008, Singapore
Tan CM et al (2009) Analysis of humidity effects on the degradation of high-power white LEDs. Microelectron Reliab 49(9–11):1226–1230
Hyun Ho S, Jae Soo Y (2008) Failure analysis of a phosphor-converted white light-emitting diode due to the CaS:Eu phosphor. Jap J Appl Phys 47(5):3524–3526
Tsai CC et al (2009) Investigation of Ce:YAG doping effect on thermal aging for high-power phosphor-converted white-light-emitting diodes. IEEE Trans Device Mater Reliab 9(3):367–371
Uddin A, Wei A, Andersson T (2005) Study of degradation mechanism of blue light emitting diodes. Thin Solid Films 483(1–2):378–381
Meneghini M et al (2008) A review on the reliability of GaN-based LEDs. IEEE Trans Device Mater Reliab 8(2):323–331
Manyakhin F, Kovalev A, Yunovich A (1998) Aging mechanisms of InGaN/AlGaN/GaN light-emitting diodes operating at high currents. MRS Internet J Nitride Semicond Res 3:53
Pavesi M et al (2004) Optical evidence of an electrothermal degradation of InGaN-based light-emitting diodes during electrical stress. Appl Phys Lett 84:3403
Meneghini M et al (2006) High-temperature failure of GaN LEDs related with passivation. Superlattices Microstruct 40(4–6):405–411
Meneghini M et al (2007) Reversible degradation of ohmic contacts on p-GaN for application in high-brightness LEDs. IEEE Trans Electron Devices 54(12):3245–3251
Polyakov A et al (2002) Enhanced tunneling in GaN/InGaN multi-quantum-well heterojunction diodes after short-term injection annealing. J Appl Phys 91:5203
Meneghesso G et al (2009) Electrostatic discharge and electrical overstress on GaN/InGaN light emitting diodes. IEEE Microelectronics Reliability 39:635–646
Youn CJ et al (2003) Influence of various activation temperatures on the optical degradation of Mg doped InGaN/GaN MQW blue LEDs. J Cryst Growth 250(3–4):331–338
Chuo CC, Lee CM, Chyi JI (2001) Interdiffusion of In and Ga in InGaN/GaN multiple quantum wells. Appl Phys Lett 78:314
Lee W et al (2006) Effect of thermal annealing induced by p-type layer growth on blue and green LED performance. J Cryst Growth 287(2):577–581
Grillot PN et al (2006) Sixty thousand hour light output reliability of AlGaInP light emitting diodes. IEEE Trans Device Mater Reliab 6(4):564–574
Rossi F et al (2006) Influence of short-term low current dc aging on the electrical and optical properties of InGaN blue light-emitting diodes. J Appl Phys 99:053104
Craford M, Steranka F (1994) Light-emitting diodes. Encyclopedia Appl Phys 8:85–514
Seager C et al (2002) Drift, diffusion, and trapping of hydrogen in p-type GaN. J Appl Phys 92:7246
Polyakov A et al (2003) Hydrogen plasma passivation effects on properties of p-GaN. J Appl Phys 94:3960
Myers S et al (2002) Electron-beam dissociation of the MgH complex in p-type GaN. J Appl Phys 92:6630
Meneghini M et al (2010) A review on the physical mechanisms that limit the reliability of GaN-based LEDs. IEEE Trans Electron Devices 57:108–118
Arnold J (2007) When the lights go out: LED failure modes and mechanisms. http://www.emsnow.com/cnt/files/WhitePapers/DFRLEDFailures.pdf
Koh SW (2009) Fatigue modeling of nano-structured chip-to-package interconnections, PhD Thesis, Georgia Institute of Technology, publication number 3364229
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2013 Springer Science+Business Media, LLC
About this chapter
Cite this chapter
Koh, S., van Driel, W.D., Yuan, C.A., Zhang, G.Q. (2013). Degradation Mechanisms in LED Packages. In: van Driel, W., Fan, X. (eds) Solid State Lighting Reliability. Solid State Lighting Technology and Application Series, vol 1. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-3067-4_5
Download citation
DOI: https://doi.org/10.1007/978-1-4614-3067-4_5
Published:
Publisher Name: Springer, New York, NY
Print ISBN: 978-1-4614-3066-7
Online ISBN: 978-1-4614-3067-4
eBook Packages: EngineeringEngineering (R0)