Skip to main content

An Introduction to System Reliability for Solid-State Lighting

  • Chapter
  • First Online:
Solid State Lighting Reliability

Part of the book series: Solid State Lighting Technology and Application Series ((SSLTA,volume 1))

Abstract

Solid-State Lighting (SSL) applications are slowly but gradually pervading into our daily life. An SSL system is composed of an light-emitting diode (LED) engine with a microelectronic driver(s) in a housing that also supplies the optic design. Knowledge of system-level reliability is crucial for the business success of future SSL systems, and also a very scientific challenge. In practice, a malfunction of the system might be induced by the failure and/or degradation of the subsystems/interfaces. Extra costs, in terms of exceed efforts/designs/parts, have been applied to the system in order to secure the guaranteed reliability performance of SSL system. Most SSL system designs allow few failures of the subsystem/interface during the application period. Hence, a significant cost reduction can be achieved when the system-level reliability is well understood by proper experimental and simulation techniques. This chapter covers the reliability of total SSL systems including the reliability theories and practices for all (sub) components, such as LED engines, drivers, and fixtures.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 169.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 219.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 219.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Nelson WB (1990) Accelerated testing: statistical models, test plans, and data analysis. In: Series in probability and statistics. Wiley, New York, ISBN:0-471-52277-5

    Google Scholar 

  2. Tobias P (1994) Applied reliability. Chapman & Hall, London. ISBN 0-442-00469-9

    Google Scholar 

  3. Dodson B, Nolan D (2002) Reliability engineering handbook. QA Publishing, LLC, Tucson, AZ. ISBN 0-8247-0364-2

    Google Scholar 

  4. Kececioglu Z (2003) Robust engineering design-by-reliability with emphasis on mechanical components and structural reliability. Destech Publications Inc., Lancaster, PA. ISBN 1-932078-07-X

    Google Scholar 

  5. Stamatis DH (2003) Failure mode and effect analysis: FMEA from theory to execution. ASQ Quality Press, Milwaukee, WI. ISBN 0-87389-598-3

    Google Scholar 

  6. Misra KB (2008) Handbook of performability engineering. Springer, London. ISBN 978-1-84800-130-5

    Book  Google Scholar 

  7. http://en.wikipedia.org/wiki/Reliability

  8. Zhang GQ, van Roosmalen AJ (2006) Reliability challenges in the nanoelectronics era. J Microelectron Reliab 46:1403–1414

    Article  Google Scholar 

  9. Liddell HG, Scott R (1940) A Greek-English Lexicon. Perseus Digital Library

    Google Scholar 

  10. Wikipedia: http://en.wikipedia.org/wiki/Complex_system

  11. Joslyn C, Rocha L (2000) Towards semiotic agent-based models of socio-technical organizations. In: Proceeding of the AI, simulation and planning in high autonomy systems (AIS 2000) conference, Tucson, Arizona, pp 70–79

    Google Scholar 

  12. Weaver W (1948) Science and complexity. Am Scientist 36:536

    Google Scholar 

  13. Nelson W (2004) Accelerated testing statistical models, test plans, and data analyses. Wiley, New York, NY. ISBN 0-471-69736-2

    Google Scholar 

  14. Rausand M, Hoyland A (2004) System reliability theory: models, statistical methods and applications. Wiley, Hoboken, NJ. ISBN 0-471-47133-X

    MATH  Google Scholar 

  15. ISO 8402 (1994) Quality management and quality assurance—vocabulary. http://www.iso.org/iso/iso_catalogue/catalogue_ics/catalogue_detail_ics.htm?csnumber=20115

  16. Calce: Center for Advanced Life Cycle Engineering. http://www.calce.umd.edu/

  17. Illuminating Engineering Society (2008) LM-80-08. Approved method for measuring maintenance of led light sources, p.10, ISBN: 9780879952273

    Google Scholar 

  18. Illuminating Engineering Society (2008) LM-79-08. Approved method: electrical and photometric measurements of solid-state lighting products, p.16, ISBN: 978-0-87995-226-6

    Google Scholar 

  19. U.S. Department of Defense (1965) MIL-HDBK 217: military handbook for reliability prediction of electronic equipment, Version A. 918

    Google Scholar 

  20. Technologies T (2001) Special Report SR-332: reliability prediction procedure for electronic equipment. Telcordia Customer Service, Piscataway, NJ

    Google Scholar 

  21. Denson W (1999) A tutorial: PRISM. RAC J 21(3):1–6

    Google Scholar 

  22. China Military Standard (1998) GJB299B, Handbook for reliability prediction for electronic device, Bejing, pp 12–39

    Google Scholar 

  23. Villemeur A (1992) Reliability, availability, maintainability and safety assessment: methods and techniques. Translated from French Edition by Cartier A, LMC (eds). Wiley, New York

    Google Scholar 

  24. Denson W (1998) The history of reliability prediction. IEEE Trans Reliab 47(3-SP):321–328

    Google Scholar 

  25. Wong KL (1990) What is wrong with the existing reliability prediction methods? Qual Reliab Eng Int 6(4):251–257

    Article  Google Scholar 

  26. Painton L, Campbell J (1995) Genetic algorithms in optimization of system reliability. IEEE Trans Reliab 44(2):172–178

    Article  Google Scholar 

  27. Chaudhuri G, Hu K, Afshar N (2001) A new approach to system reliability. IEEE Trans Reliab 50(1):75–84

    Article  Google Scholar 

  28. Tian X (University of Arizona Tucson) (2002) Comprehensive review of estimating system-reliability confidence-limits from component-test data. In: Proceedings annual reliability and maintainability symposium, pp 56–60

    Google Scholar 

  29. Pecht M (2009) Product reliability, maintainability, and supportability handbook, 2nd edn. CRC Press, Boca Raton, FL 33487–2742. ISBN 978-0-8493-9879-7

    Book  Google Scholar 

  30. IEC (1990) IEC 61025: fault tree analysis. IEC, New York

    Google Scholar 

  31. Meyn SP, Tweedie RL (2008) Markov chains and stochastic stability, 2nd edn. Cambridge University Press, Cambridge

    Google Scholar 

  32. Torres-Toledano J, Sucar L (2004) Bayesian networks for reliability of complex systems. In: Coelho H (ed) Progress in artificial intelligence, IBERAMIA98, Lisbon, Portugal, October 5–9, Springer, pp 195–206

    Google Scholar 

  33. Jensen F (1996) An introduction to Bayesian networks. UCL Press, London

    Google Scholar 

  34. Bobbio A, Portinale L, Minichino M, Ciancamerla E (2001) Improving the analysis of dependable systems by mapping fault trees into Bayesian networks. Reliab Eng Syst Saf 71(3):249–260

    Article  Google Scholar 

  35. Simon Ch, Weber Ph, Levrat E (2007) Bayesian networks and evidence theory to model complex systems reliability. J Comput 2(1):33–43

    Google Scholar 

  36. Netica software available at http://www.norsys.com/

  37. LED reliability and lumen maintenance. www.philipslumileds.com

  38. Hechfellner R, Landau S (2009) Understanding LED performance, Led Lighting Magazine, pp 45–53

    Google Scholar 

  39. US Department of Energy (DOE) (2009) LED applications. www.ssl.energy.gov

  40. Alliance for Solid-State Illumination Systems and Technologies (ASSIST Program). http://www.lrc.rpi.edu/programs/solidstate/assist/index.asp

  41. Mottier P (2009) LED for lighting application. Wiley, Hoboken, NJ 07030, ISBN 978-1-84821-145-2

    Book  Google Scholar 

  42. HB Led & Led Packaging (2009) Yole Development report, 2009. http://www.yole.fr/

  43. NF EN 13201-3 standard for photometric performance of public lighting facilities, Europe, pp 69–89

    Google Scholar 

  44. LED professional review, July/August edition, 2010, pp 7–11

    Google Scholar 

  45. Tarashioon S, Koh SW, van Driel WD, Zhang GQ (2010) High temperature reliability of drivers for solid state lighting. In: Proceedings of the LS12-WLED3 conference, The Netherlands, July 2010

    Google Scholar 

  46. Erinc M, Kloosterman J, van Driel WD, Gielen AWJ, Zhang GQ (2010) On solder joint reliability in LEDs by accelerated life testing. In: Proceedings of the LS12-WLED3 conference, The Netherlands, July 2010

    Google Scholar 

  47. Led luminaire lifetime: recommendations for testing and reporting, solid state lighting product quality initiative, next generation lighting industry alliance with the U.S. Department of Energy, 2nd edition, june 2011. http://apps1.eere.energy.gov/buildings/publications/pdfs/ssl/led_luminaire-lifetime-guide_june2011.pdf

  48. Evertz FE, van Driel WD, Kloosterman J, Vanlier G, Zhang GQ (2010) Towards a system level reliability approach for solid state lighting. In: Proceedings of the LS12-WLED3 conference, The Netherlands, July 2010

    Google Scholar 

  49. van Driel WD, Li XP, Chen J, Evertz F, Zhang GQ (2011) Solid state lighting reliability: from components to system. In: Proceedings of the China SSL conference, Shenzhen, China, October 2011

    Google Scholar 

  50. van Driel WD, Evertz F, Zhang GQ (2011) Towards a system level reliability approach for solid state lighting. J Light Vis Environ 35(3):267–273

    Google Scholar 

  51. FIDES Group (2004) FIDES Guide Issue A: reliability methodology for electronic systems. http://www.fides-reliability.org

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to W. D. van Driel .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2013 Springer Science+Business Media, LLC

About this chapter

Cite this chapter

van Driel, W.D., Evertz, F.E., Zaal, J.J.M., NĂ¡poles, O.M., Yuan, C.A. (2013). An Introduction to System Reliability for Solid-State Lighting. In: van Driel, W., Fan, X. (eds) Solid State Lighting Reliability. Solid State Lighting Technology and Application Series, vol 1. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-3067-4_12

Download citation

  • DOI: https://doi.org/10.1007/978-1-4614-3067-4_12

  • Published:

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4614-3066-7

  • Online ISBN: 978-1-4614-3067-4

  • eBook Packages: EngineeringEngineering (R0)

Publish with us

Policies and ethics