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High-Linearity Transconductance Amplifiers with Digital Correction Capability

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Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip

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Abstract

The push towards wider bandwidths in baseband filter applications calls for operational transconductance amplifiers (OTAs) with progressively better linearity at higher frequencies. In this chapter, an architectural solution is described that can be applied to diverse circuit-level OTA configurations. Effective linearization over a wide frequency range demands a mechanism to correct for high-frequency effects and process variations. Accordingly, digital programmability to ensure high linearity and compatibility with modern CMOS technologies is discussed. The linearization technique utilizes two matched OTAs to cancel harmonic distortion components, creating a robust architecture. Compensation for process variations and frequency-dependent distortion based on Volterra series analysis is achieved by employing a delay equalization scheme with on-chip programmable resistors.

This chapter includes portions reprinted with permission, from “Attenuation-predistortion linearization of CMOS OTAs with digital correction of process variations in OTA-C filter applications,” M. Mobarak, M. Onabajo, J. Silva-Martinez, and E. Sánchez-Sinencio, IEEE J. Solid-State Circuits, vol. 45, no. 2, pp. 351–367, Feb. 2010, © 2010 IEEE.

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Authors and Affiliations

  1. Department of Electrical and Computer Engineering, 409 Dana Research Center, Northeastern University, 360 Huntington Avenue, Boston, MA, 02115, USA

    Marvin Onabajo

  2. Department of Electrical and Computer Engineering, Texas A&M University, 111A Zachry Engineering Building, College Station, TX, 77843-3128, USA

    Jose Silva-Martinez

Authors
  1. Marvin Onabajo
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  2. Jose Silva-Martinez
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Onabajo, M., Silva-Martinez, J. (2012). High-Linearity Transconductance Amplifiers with Digital Correction Capability. In: Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip. Springer, Boston, MA. https://doi.org/10.1007/978-1-4614-2296-9_3

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  • DOI: https://doi.org/10.1007/978-1-4614-2296-9_3

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