Abstract
This chapter is dedicated to the realization of integrated test concepts in the millimeter-wave range. The general architecture of a direct integrated test concept is presented. Different approaches in the analog, mixed-signal, and RF domain are outlined. In the following, possibilities for a test signal generation, e.g. single-tone, Y-factor, and loopback test are discussed regarding their performance parameter determination capabilities. Furthermore, an overview of the functionality, usability, and characterization of IQ-modulators for the generation of single-sideband test signals is given. The end of the chapter covers the injection of the test signal into the receiver path via directional couplers and gives an overview of implementation and working principle of power detectors for the determination of the test signal strength.
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D. Kissinger, B. Laemmle, L. Maurer, and R. Weigel, “Integrated test for silicon front ends,” IEEE Microw. Mag., vol. 11, no. 3, pp. 87–94, May 2010.
S. S. Akbay, A. Halder, A. Chatterjee, and D. Keezer, “Low-cost test of embedded RF/analog/mixed-signal circuits in SOPs,” IEEE Trans. Adv. Packag., vol. 27, no. 2, pp. 352–363, May 2004.
G. W. Roberts, “Improving the testability of mixed-signal integrated circuits,” in Proc. IEEE Custom Integr. Circuits Conf., Santa Clara, CA, May 1997, pp. 214–221.
B. Dufort and G. W. Roberts, “On-chip analog signal generation for mixed-signal built-in self-test,” IEEE J. Solid-State Circuits, vol. 34, no. 3, pp. 318–330, Mar. 1999.
J.-S. Yoon and W. R. Eisenstadt, “Embedded loopback test for RF ICs,” IEEE Trans. Instrum. Meas., vol. 54, no. 5, pp. 1715–1720, Oct. 2005.
U. Tietze and C. Schenk, Halbleiter-Schaltungstechnik, (in German), 13rd ed. Springer-Verlag, 2010.
J. Yoon and W. R. Eisenstadt, “Lumped passive circuits for 5GHz embedded test of RF SoCs,” in IEEE Int. Symp. Circuits Syst., Vancouver, Canada, May 2004, pp. 241–244.
R. G. Meyer, “Low-power monolithic RF peak detector analysis,” IEEE J. Solid-State Circuits, vol. 30, no. 1, pp. 65–67, Jan. 1995.
T. Zhang, W. R. Eisenstadt, R. M. Fox, and Q. Yin, “Bipolar microwave RMS power detectors,” IEEE J. Solid-State Circuits, vol. 41, no. 9, pp. 2188–2192, Sep. 2006.
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Kissinger, D. (2012). Millimeter-Wave Built-In Test Concepts. In: Millimeter-Wave Receiver Concepts for 77 GHz Automotive Radar in Silicon-Germanium Technology. SpringerBriefs in Electrical and Computer Engineering(). Springer, Boston, MA. https://doi.org/10.1007/978-1-4614-2290-7_7
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DOI: https://doi.org/10.1007/978-1-4614-2290-7_7
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