Abstract
We outline a new systematic approach to extracting high-quality information from HAADF–STEM images which will be beneficial to the characterization of beam-sensitive materials. The idea is to treat several, possibly many, low-electron dose images with specially adapted digital image processing concepts at a minimum allowable spatial resolution. Our goal is to keep the overall cumulative electron dose as low as possible while still staying close to an acceptable level of physical resolution. We shall present the main conceptual imaging concepts and restoration methods that we believe are suitable for carrying out such a program and, in particular, allow one to correct special acquisition artifacts which result in blurring, aliasing, rastering distortions, and noise.
This research was supported in part by the College of Arts and Sciences at the University of South Carolina; the Leibniz program and Special Priority Program SPP 1324, funded by German Research Foundation; MURI ARO Grant # W911NF-07-1-0185; NSF Grant # DMS-0915104; and National Academies Keck Futures Initiative grant NAKFI IS11.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Benjamin Berkels (2010) Joint methods in imaging based on diffuse image representations. Dissertation, University of Bonn
Binev P, Blanco-Silva F, Blom D, Dahmen W, Sharpley R, Vogt T (2009) Superresolution image reconstruction by nonlocal-means applied to HAADF–STEM. IMI Preprint Series 2009:06, University of South Carolina
Buades A, Coll B, Morel JM (2005) A review of image denoising algorithms with a new one. Multisc Model Simul 4:490–530
Buban JP, Ramasse Q, Gipson B, Browning ND, Stahlberg H (2010) High-resolution low-dose scanning transmission electron microscopy. J Electron Microsc (Tokyo) 59(2):103–112
Crewe AV, Wall J, Langmore L (1970) Visibility of single atoms. Nature 168:1338–1340
Erni R, Rossell MD, Kisielowski C, Dahmen U (2009) Atomic-resolution imaging with a sub-50-pm electron probe. Phys Rev Lett 102:096101.1–096101.4
Han J, Berkels B, Droske M, Hornegger J, Rumpf M, Schaller C, Scorzin J, Urbach H (2007) Mumford-Shah model for one-to-one edge matching. IEEE Trans Image Process 16(11):2720–2732
Hartel P, Rose H, Dinges C (1996) Conditions and reasons for incoherent imaging in STEM. Ultramicroscopy 63:93–114
Huang TS, Tsai RY (1984) Multi-frame image restoration and registration. Adv Comput Vis Image Process 1:317–339
Kisielowski C, Freitag B, Bischoff M, van Lin H, Lazar S, Knippels G, Tiemeijer P, van der Stam M, von Harrach S, Steckelenburg M, et al. (2008) Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-Å information limit. Microsc Microanal 14:469–477
Markus Navratil (2011) How to compare patches of electron micrographs? Diploma Thesis, RWTH Aachen
Ortalan V, Uzun A, Gates BC, Browning ND (2010) Direct imaging of single metal atoms and clusters in the pores of dealuminated HY zeolite. Nature Nanotechnol 5:506–510
Pennycook SJ, Boatner LA (1988) Chemically sensitive structure-image with a scanning transmission electron microscope. Science 336:565–567
Protter M, Elad M, Takeda H, Milanfar P (2009) Generalizing the nonlocal-means to super-resolution reconstruction. IEEE Trans Image Process 18(1):36–51
Pyrz WD, Blom DA, Vogt T, Buttrey DJ (2008) Direct imaging of the MoVTeNbO M1 phase using an aberration-corrected high-resolution scanning transmission electron microscope. Angew Chem Int Edit 47(15):2788–2791
Sawada H, Tanishiro Y, Ohashi N, Tomita T, Hosokawa F, Kaneyama T, Kondo Y, Takayanagi K (2009) STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun. J Electron Microsc (Tokyo) 58(6):357–361
Acknowledgements
The authors would like to thank Amit Singer and Yoel Shkolnisky for interesting discussions and for introducing us to the method of nonlocal means. We are also indebted to Benjamin Berkels for making his image registration code available to us.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2012 Springer Science+Business Media, LLC
About this chapter
Cite this chapter
Binev, P. et al. (2012). High-Quality Image Formation by Nonlocal Means Applied to High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy (HAADF–STEM). In: Vogt, T., Dahmen, W., Binev, P. (eds) Modeling Nanoscale Imaging in Electron Microscopy. Nanostructure Science and Technology. Springer, Boston, MA. https://doi.org/10.1007/978-1-4614-2191-7_5
Download citation
DOI: https://doi.org/10.1007/978-1-4614-2191-7_5
Published:
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4614-2190-0
Online ISBN: 978-1-4614-2191-7
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)