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High Resolution ExitWave Restoration

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Book cover Modeling Nanoscale Imaging in Electron Microscopy

Part of the book series: Nanostructure Science and Technology ((NST))

Abstract

We review the use of restoration methods that recover the complex specimen exit wave from a suitably conditioned data set of high resolution transmission electron microscope images. Various levels of theory underlying the post-acquisition processing required are described together with the requirements for aberration measurement.

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Notes

  1. 1.

    The origin of the use of real space order when describing an aberration coefficient originates from the ray-optical theory of Seidel aberrations which are described in terms of displacements of ray-path intersections with the image plane. As these displacements are proportional to the gradient of the wave aberration function, an nth order Seidel aberration corresponds to a term of order n + 1 in W. As an example, the image aberration for defocus is linear in angle and is hence described as a first-order aberration, whereas the image aberration for spherical aberration is cubic in angle and is hence described as a third-order aberration.

  2. 2.

    As the apparent strength of the tilt coils is often sensitive to the condenser lens and objective lens pre-field excitation this must be constant between calibration and experiment.

  3. 3.

    Current reversal centre alignment involves reversing the current of the objective lens but is no longer practicable with the strong lenses used in modern instruments.

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Authors and Affiliations

  1. Department of Materials, Parks Road, OX1 3PH, Oxford, UK

    Sarah J. Haigh

  2. University of Manchester Materials Science Centre, Grosvenor Street, Manchester, M1 7HS, UK

    Sarah J. Haigh

  3. Department of Materials, University of Oxford, Parks Road, OX1 3PH, Oxford, UK

    Angus I. Kirkland

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Correspondence to Angus I. Kirkland .

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Editors and Affiliations

  1. NanoCenter, Dept. of Chemistry & Biochem., University of South Carolina, Greene Street 1212, Columbia, 29208, South Carolina, USA

    Thomas Vogt

  2. , Dept. of Mathematics, Inst. Geometrie & Praktische Mathemat., Templergraben 55, Aachen, 52056, Germany

    Wolfgang Dahmen

  3. Interdisciplin. Mathematics Instit., Dept. Mathematics, University of South Carolina, Greene Street 1523, Columbia, 29208, South Carolina, USA

    Peter Binev

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Haigh, S.J., Kirkland, A.I. (2012). High Resolution ExitWave Restoration. In: Vogt, T., Dahmen, W., Binev, P. (eds) Modeling Nanoscale Imaging in Electron Microscopy. Nanostructure Science and Technology. Springer, Boston, MA. https://doi.org/10.1007/978-1-4614-2191-7_3

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