Abstract
In the previous chapter, designs of high-performance and delay-insensitive current sensing interconnects have been presented. In delay-insensitive transmission, validity of the data is encoded within the data itself at the transmitter, and the data validity test, i.e., completion detection, as well as data decoding is performed at the receiver. The delay incurred due to completion detection increases with bit width of the transmission channel and affects the performance of the communication significantly. In order to overcome this overhead, a high speed completion detection technique along with its CMOS implementation is designed and presented in this chapter. Unlike the conventional detection circuits, the delay of the presented completion detection circuit is not affected by the bit width of the channel. This optimizes the performance of delay-insensitive current sensing links further since it was already demonstrated in Chap.4 that the current sensing interconnects achieve higher performance and better power efficiency than the interconnects using voltage-mode signaling with repeaters or pipelines.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsAuthor information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2012 Springer Science+Business Media, LLC
About this chapter
Cite this chapter
Nigussie, E.E. (2012). Enhancing Completion Detection Performance. In: Variation Tolerant On-Chip Interconnects. Analog Circuits and Signal Processing. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-0131-5_5
Download citation
DOI: https://doi.org/10.1007/978-1-4614-0131-5_5
Published:
Publisher Name: Springer, New York, NY
Print ISBN: 978-1-4614-0130-8
Online ISBN: 978-1-4614-0131-5
eBook Packages: EngineeringEngineering (R0)