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Decentralized Diagnosis of Discrete Event Systems

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Discrete Event Systems

Part of the book series: SpringerBriefs in Electrical and Computer Engineering ((BRIEFSELECTRIC))

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Abstract

Chapter 3 handles the problem of achieving fault diagnosis of discrete event systems using a decentralized processing structure. It classifies the decentralized diagnosis approaches into two main categories: 1) the approaches using a global model in order to construct the local diagnosers and 2) the approaches using local models in order to construct the local diagnosers. Each of these two categories is divided into two main subcategories: the approaches considering a fault as the execution of an event and the approaches considering a fault as the violation of specifications. Chapter 3 develops one typical approach of each of these categories.

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Correspondence to Moamar Sayed-Mouchaweh .

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Sayed-Mouchaweh, M. (2014). Decentralized Diagnosis of Discrete Event Systems. In: Discrete Event Systems. SpringerBriefs in Electrical and Computer Engineering. Springer, New York, NY. https://doi.org/10.1007/978-1-4614-0031-8_3

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  • DOI: https://doi.org/10.1007/978-1-4614-0031-8_3

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  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4614-0030-1

  • Online ISBN: 978-1-4614-0031-8

  • eBook Packages: EngineeringEngineering (R0)

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