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Small X-Ray Tubes for Energy Dispersive Analysis Using Semiconductor Spectrometers

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Advances in X-Ray Analysis

Abstract

Fast X-ray fluorescence analysis with radioisotope excitation requires intense sources to produce reasonable counting rates. The inconvenience of handling such sources and the small number of suitable radioisotopes places severe limitations on their use.

We have explored the possibility of using low-power X-ray tubes as exciting sources for energy-dispersive fluorescence analysis. The principal advantage to X-ray tubes is the ability to produce X-ray fluxes to three orders of magnitude higher than those obtained with convenient radioisotope sources while dissipating only a few watts in the tube. Furthermore, the variety of possible anode materials and range of currents in the tube make possible optimum choice of exciting energy and intensity for particular applications.

We have designed and tested such tubes in a variety of anode configurations suitable for fluorescence excitation. Using either X-ray filtering techniques or multiple fluorescence geometries it is possible to significantly reduce the Brems Strahlung background relative to characteristic radiation.

As compared with noimal radioisotope-target assemblies, excitation of a sample by the X-ray tube results in comparable sensitivity in only a tenth to one hundredth of the time.

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References

  1. R. D. Giauque, “A Radioisotope Source-Target Assembly for X-Ray Spectrometry”, Anal. Chem., 40 (1968) 2075.

    Article  CAS  Google Scholar 

  2. M. Green and V. E. Cosslett, “The Efficiency of Production of Characteristic X-Radiation in Thick Targets of a Pure hlement”, Proc. Phys. Soc. (London) 78 (1961) 1206.

    Article  CAS  Google Scholar 

  3. F. S. Goulding J. M. Jaklevic, B. V. Jarrett and D. A. Landis, “Detector Background and Sensitivity of X-ray Fluorescence Spectrometers”, to be presented at the 20th Annual Denver X-ray Conference, August 11–13 1971 LBL-9 Lawrence Berkeley Lab.

    Google Scholar 

  4. D. A. Landis, F. S. Goulding and R. H. Pehl, “Pulsed Feedback Techniques for Semiconductor Detector Radiation Spectrometers”, IEEE Trans. Nuc. Sci., NS-18, No. 1 (1971) pg. 115–124.

    Article  Google Scholar 

  5. R. D. Giauque and J. M. Jaklevic, “Rapid Quantitative Analysis by X-Ray Spectrometry”, to be presented at the 20th Annual Denver X-ray Conference, August 11–13 1971.

    Google Scholar 

  6. J. A. Bearden, “X-Ray Wavelengths”, Rev. Mod. Phys., 39 (1967) 78.

    Article  CAS  Google Scholar 

  7. W. H. McMaster, N. K. Del Grande, J. H. Mallett and J. H. Hubbell “Compilation of X-ray Cross Sections”, UCRL-50174 Section II Lawrence Radiation Laboratory, Livermore, California

    Google Scholar 

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© 1972 Springer Science+Business Media New York

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Jaklevic, J.M., Giauque, R.D., Malone, D.F., Searles, W.L. (1972). Small X-Ray Tubes for Energy Dispersive Analysis Using Semiconductor Spectrometers. In: Heinrich, K.F.J., Barrett, C.S., Newkirk, J.B., Ruud, C.O. (eds) Advances in X-Ray Analysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-9966-7_19

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  • DOI: https://doi.org/10.1007/978-1-4613-9966-7_19

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-9968-1

  • Online ISBN: 978-1-4613-9966-7

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