Abstract
A system has been designed and tested for rapid energy dispersive diffractometry and simultaneous fluorescence analysis. A turntable composed of the sample chamber with attached air-cooled x-ray tube allows the 29 angle to be. varied with respect to the stationary Si(Li) detector. Data for most analyses can be obtained in one minute per sample. Results are stored in the memory of a multichannel analyzer and are read out on a CRT, strip chart recorder or tabulated in digital format by a computer.
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References
F.S. Goulding and J.M. Jaklevic “Trace Element AnaLysis by-X-ray Fluorescence” University of California Publication UCRL-202625 May 1971.
B.C. Giessen and G.C. Gordon “X-ray Diffraction: New High Speed Technique based on X-ray Spectrophotograph” SCIENCE Volume 159 1968, Page 973.
A.P. Langheinrich, J.W. Forster and W.M. Tuddenham “Recent Applications of Energy Dispersion X-ray Spectrometry” Paper presented at 1969 Northwest Regional Meeting of the American Chemical Society, Salt Lake City, Utah June 1969.
B.C. Giessen and G.C. Gordon “Recent Developments in Spectrometry Powder Diffractometry” Norelco Reporter Volume 17, No. 2, 1970, Page 19.
R. Fitzgerald and P. Gantzel “X-ray Energy Spectrometry in the 0.1–10 A Range” American Society for Testing and Materials, Special Technical Publication No. 485, 1971.
W.B. Jones and R.A. Carpenter “Nondispersive X-ray Fluorescence Spectrometer” Advances in X-ray Analysis, Volume 11 Pages 214–229 edited by J.B. Newkirk, G.R. Mallett and J. Fay.
G.G. Johnson, Jr. and E.W. White “X-ray Emission Wavelengths and keV Tables for Nondiffractive Analysis” ASTM Data Series D546, April 1970.
A.P. Langheinrich, J.W. Forster, T.A. Linn, Jr. “Energy Dispersion X-ray (EDX) Analysis in the Non-Ferrous Mining Industry” Paper presented at the ISA AID National Symposium Houston, Texas, April 1971.
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© 1972 Springer Science+Business Media New York
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Martin, G.W., Klein, A.S. (1972). A Complete Instrumental System for Energy Dispersive Diffractometry and Fluorescence Analysis. In: Heinrich, K.F.J., Barrett, C.S., Newkirk, J.B., Ruud, C.O. (eds) Advances in X-Ray Analysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-9966-7_18
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DOI: https://doi.org/10.1007/978-1-4613-9966-7_18
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