Abstract
Two years ago a paper (1) on a new method of X-ray fluorescence analysis was presented. This method uses a variable take-off geometry and permits a quantitative analysis without calibration curves or the knowledge of the primary X-ray spectrum(2). As references either chemically analysed samples or pure elements are used. In case that only primary excitation exists, under the aspect mentioned above, the method is to be regarded as “absolute”. For secondary excitation a simple parabolic approximation has been introduced, which requires a calibration. This paper gives an outline on the progress obtained during the last two years.
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References
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© 1972 Springer Science+Business Media New York
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Ebel, H., Ebel, M.F. (1972). On the Method of Variable Take-Off Angle for Quantitative X-Ray Fluorescence Analysis (XRFA). In: Heinrich, K.F.J., Barrett, C.S., Newkirk, J.B., Ruud, C.O. (eds) Advances in X-Ray Analysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-9966-7_12
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DOI: https://doi.org/10.1007/978-1-4613-9966-7_12
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