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Structural Analysis of Nb-NbxOy-Pb Josephson Tunnel Junctions for 2e/h Measurements

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Advances in Cryogenic Engineering Materials

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Abstract

Thin-film-deposited Nb-NbxOy-Pb Josephson tunnel junctions have been adopted at the Istituto Elettrotecnico Nazionale in recent years to improve the monitoring of the Italian voltage standard.

Part of the Superconductivity Project supported by the Consiglio Nazionale delle Ricerche of Italy.

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References

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Author information

Authors and Affiliations

  1. Centro Studi e Laboratori Telecomunicazioni, Turin, Italy

    M. Cocito

  2. Istituto Elettrotecnico Nazionale “Galileo Ferraris”, Turin, Italy

    V. Lacquaniti & G. Marullo

  3. Istituto di Fisica della Università di Salerno, Salerno, Italy

    R. Vaglio

Authors
  1. M. Cocito
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  2. V. Lacquaniti
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  3. G. Marullo
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  4. R. Vaglio
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Editor information

Editors and Affiliations

  1. National Bureau of Standards, Boulder, Colorado, USA

    A. F. Clark  & R. P. Reed  & 

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© 1980 Plenum Press, New York

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Cocito, M., Lacquaniti, V., Marullo, G., Vaglio, R. (1980). Structural Analysis of Nb-NbxOy-Pb Josephson Tunnel Junctions for 2e/h Measurements. In: Clark, A.F., Reed, R.P. (eds) Advances in Cryogenic Engineering Materials . Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-9859-2_75

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  • DOI: https://doi.org/10.1007/978-1-4613-9859-2_75

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-9861-5

  • Online ISBN: 978-1-4613-9859-2

  • eBook Packages: Springer Book Archive

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