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Structural Analysis of Nb-NbxOy-Pb Josephson Tunnel Junctions for 2e/h Measurements

  • M. Cocito
  • V. Lacquaniti
  • G. Marullo
  • R. Vaglio

Abstract

Thin-film-deposited Nb-NbxOy-Pb Josephson tunnel junctions have been adopted at the Istituto Elettrotecnico Nazionale in recent years to improve the monitoring of the Italian voltage standard.

Keywords

Tunnel Junction Maximum Current Density Niobium Oxide Auger Analysis Fundamental Resonance Frequency 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Press, New York 1980

Authors and Affiliations

  • M. Cocito
    • 1
  • V. Lacquaniti
    • 2
  • G. Marullo
    • 2
  • R. Vaglio
    • 3
  1. 1.Centro Studi e Laboratori TelecomunicazioniTurinItaly
  2. 2.Istituto Elettrotecnico Nazionale “Galileo Ferraris”TurinItaly
  3. 3.Istituto di Fisica della Università di SalernoSalernoItaly

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