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Material Characterization by Acoustic Microscope with Line-Focus Beam

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Acoustical Imaging

Part of the book series: Acoustical Imaging ((ACIM,volume 12))

Abstract

The V(z) curves1 have played a very important role in the recent rapid progress of development of the mechanically scanned acoustic microscope using a highly convergent beam. In the acoustical imaging measurements, the V(z) curves have been effectively employed for the interpretation of contrast mechanisms in acoustic images1-4 obtained in scanning version and for the imaging signal processing for obtaining false-color micrographs5 . Further, it has been found out that the V(z) curves are of particular importance in the quantitative measurements of acoustic properties of materials because they are unique and characteristic of specific materials. Recently, for this latter case, a new acoustic line-focus beam' has been introduced with which the nonscanning reflection acoustic microscope can appropriately pick up acoustic properties of solid materials, including acoustic anisotropy.8-10

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© 1982 Plenum Press, New York

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Kushibiki, Ji., Ohkubo, A., Chubachi, N. (1982). Material Characterization by Acoustic Microscope with Line-Focus Beam. In: Ash, E.A., Hill, C.R. (eds) Acoustical Imaging. Acoustical Imaging, vol 12. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-9780-9_10

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  • DOI: https://doi.org/10.1007/978-1-4613-9780-9_10

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-9782-3

  • Online ISBN: 978-1-4613-9780-9

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