Practical aspects of quantitative phase analysis

Abstract

In the previous chapters, we discussed the basic techniques and instrumentation for quantitative diffractometry. We now come to the next step in QXRD—the practical realization of the theoretical concepts outlined earlier. In other words, we have to delineate the techniques and conditions required to carry out this task with acceptable precision and accuracy. The quantity that we actually measure is the diffraction intensity, and the objective in this chapter is thus to determine the means of reducing intensity errors (both systematic and random). The pitfalls awaiting us in the practical accomplishment of QXRD can be roughly divided into three groups: instrument-, sample-, and phase-related errors.