Practical aspects of quantitative phase analysis

  • Lev S. Zevin
  • Giora Kimmel
  • Inez Mureinik

Abstract

In the previous chapters, we discussed the basic techniques and instrumentation for quantitative diffractometry. We now come to the next step in QXRD—the practical realization of the theoretical concepts outlined earlier. In other words, we have to delineate the techniques and conditions required to carry out this task with acceptable precision and accuracy. The quantity that we actually measure is the diffraction intensity, and the objective in this chapter is thus to determine the means of reducing intensity errors (both systematic and random). The pitfalls awaiting us in the practical accomplishment of QXRD can be roughly divided into three groups: instrument-, sample-, and phase-related errors.

Keywords

Sandstone Sedimentation Tungsten Magnetite Compaction 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Copyright information

© Springer-Verlag New York, Inc. 1995

Authors and Affiliations

  • Lev S. Zevin
    • 1
  • Giora Kimmel
    • 2
  • Inez Mureinik
    • 3
  1. 1.The Institutes for Applied Research and Department of Materials EngineeringBen-Gurion University of the NegevBeer-ShevaIsrael
  2. 2.Department of Materials EngineeringBen-Gurion University of the NegevBeer-ShevaIsrael
  3. 3.The Institutes for Applied ResearchBen-Gurion University of the NegevBeer-ShevaIsrael

Personalised recommendations