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Some Applications of Asymptotic Methods in Semiconductor Device Modeling

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Semiconductors

Part of the book series: The IMA Volumes in Mathematics and its Applications ((IMA,volume 59))

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Abstract

This short survey of results concerning the applications of perturbation analysis in semiconductor device modeling is devoted mostly to problems that were solved using the method of composite asymptotic expansions or the, so-called, boundary function method. Thorough description of this approach can be found in Vasil’eva and Butuzov [17], [18], [19] and in O’Malley [13], [14]. The main ideas of the method are illustrated below on the example of the singularly perturbed problem for the Gunn diode. Here the construction of the leading order terms of the asymptotic solution is discussed. This gives the opportunity to obtain the main characteristics of the device to the zeroth order. More detailed analysis of the asymptotic approximation for the solution of the Gunn diode problem, including the construction of higher order terms, will be published later. To make the presentation more compact some cumbersome details of the solution algorithm have been omitted.

This research was supported in part by the Institute for Mathematics and its Applications with funds provided by the National Science Foundation.

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© 1994 Springer-Verlag New York, Inc.

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Kalachev, L.V. (1994). Some Applications of Asymptotic Methods in Semiconductor Device Modeling. In: Coughran, W.M., Cole, J., Lloyd, P., White, J.K. (eds) Semiconductors. The IMA Volumes in Mathematics and its Applications, vol 59. Springer, New York, NY. https://doi.org/10.1007/978-1-4613-8410-6_11

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  • DOI: https://doi.org/10.1007/978-1-4613-8410-6_11

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4613-8412-0

  • Online ISBN: 978-1-4613-8410-6

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