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Modeling of dopant diffusion networks

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Part of the book series: The IMA Volumes in Mathematics and its Applications ((IMA,volume 57))

Abstract

Most of the materials used in semiconductor manufacturing have granular structure. The granularity can occur on various length scales ranging from amorphous (few nanometers) to columnar grain structures (tens or hundreds of micrometers). These scales are larger than the microscopic (atomic or molecular) scale but smaller than the macroscopic scale; one refers to these regimes as the mesoscopic regimes. Pantelides [1] points out that most industrial materials are polycrystalline, amorphous, or composite, and their properties are determined by the collective microstructure at the mesoscopic level. Yet the modeling of such materials have not been seriously investigated.

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References

  1. S. Pantelides, What is materials physics, anyway?, Physics Today, 45, number 9 (1992), 67–69.

    Article  Google Scholar 

  2. H.H. Tseng, M. Orlowski, P.J. Tobin and R.L. Hance, Fluorine diffusion on a polysilicon grain boundary network in relation to boron penetration from p + gates, IEEE Electron Device Letters, 13 (1992), 14–16.

    Article  Google Scholar 

  3. M. Orlowski, New rigorous description of diffusion and reactions on arbitrary (grain boundary) networks by a 4th rank tensor theory, International Electron Devices Meeting Conference (sponsored by Electron Devices of IEEE ), San Francisco, December 1992.

    Google Scholar 

  4. M. Orlowski, A novel concise physically motivated algorithm for the evaluation of multiphase diffusion including dopant redistribution at the interfaces, Proc. Sixth Intern. Nasecode Confer., Edited by J.J. Miller, Dublin, July 1989, Boole Press, 526–533.

    Google Scholar 

  5. M. Orlowski, New model for dopant redistribution at interfaces, Appl. Phys. Lett. 55 (1989), 1762–1764.

    Article  Google Scholar 

  6. M. Orlowski, Fractal network diffusion of fluorine and boron in polysilicon gates, in Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits: NVPAD IV, Seattle, May—June 1992 ( Sponsored by Electron Devices of IEEE ), pp. 35–40.

    Google Scholar 

  7. E. Maletsky, T. Perciante and L. Yunker, Fractals for the Classroom, Part One, Springer—Verlag, New York (1992).

    Google Scholar 

  8. J.L. Lions, Asymptotic expansions in perforated media with a periodic structure, Rocky Mountain J. Math., 10 (1980), 125–140.

    Article  MathSciNet  MATH  Google Scholar 

  9. A. Bensousan, J.L. Lions and G. Papanicolaou, Asymptotic Analysis for Periodic Structures, North-Holland, Amsterdam (1978).

    Google Scholar 

  10. D. Cioranescu and J. Saint Jean Paulin, Homogénéisation de problèmes d’évolution des ouverts à cavités, C.R. Acad. Sc. Paris, 286 (1978), 899–902.

    MathSciNet  MATH  Google Scholar 

  11. D. Cioranescu and J. Saint Jean Paulin, Homogenization in open sets with holes, J. Math. Anal. Appl., 71 (1979), 590–607.

    Article  MathSciNet  MATH  Google Scholar 

  12. D. Cioranescu and P. Donato, Homogenisation du probleme de Neumann non homogene dans des ouverts perfores, Asymptotic Analysis, 1 (1985), 115–138.

    MathSciNet  Google Scholar 

  13. A. Friedman and C. Huang, Diffusion in network,J. Math. Anal. Appl., to appear.

    Google Scholar 

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© 1994 Springer-Verlag New York, Inc.

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Friedman, A. (1994). Modeling of dopant diffusion networks. In: Mathematics in Industrial Problems. The IMA Volumes in Mathematics and its Applications, vol 57. Springer, New York, NY. https://doi.org/10.1007/978-1-4613-8383-3_3

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  • DOI: https://doi.org/10.1007/978-1-4613-8383-3_3

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4613-8385-7

  • Online ISBN: 978-1-4613-8383-3

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