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Abstract

By 1911, Rutherford and his co-workers had described the elastic scattering of energetic ions, yet it was not until 1957 that Rubin, Passell, and Bailey(1) exploited this nuclear interaction as an analytical tool. Until 1966, only a few applications were found for this method since it is not generally useful in identifying and determining impurities scattered throughout the bulk of a sample. Since that time, however, three factors have promoted its use: (1) an increasing need, particularly in the field of solid-state devices for the determination of foreign atoms concentrated on or within a few microns of the surface of an otherwise pure material, (2) a realization of the potential for obtaining concentration changes both with depth and across surfaces, and (3) the facility with which elastic scattering can be combined with channeling (see Section 2.5) to reveal the location of foreign atoms in the unit cell of single crystals.

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References

  1. S. Rubin, T. O. Passell, and L. E. Bailey, Chemical analysis of surfaces by nuclear methods, Anal. Chem. 29, 736 (1957).

    Article  CAS  Google Scholar 

  2. D. A. Thompson and W. D. Mackintosh, Stopping cross sections for 0.3 to 1.7 MeV helium ions in silicon and silicon dioxide, J. Appl. Phys. 42, 3969 (1971).

    Article  CAS  Google Scholar 

  3. C. F. Williamson, J. P. Boujot, and J. Picard, Tables of range and stopping power of chemical elements for charged particles of energy 0.05 to 500 MeV, Centre D’Etudes Nucleaires de Saclay, Report CEA-R3042 (1966).

    Google Scholar 

  4. J. F. Janni, Calculations of energy loss, range, pathlength, straggling, multiple scattering, and the probability of inelastic nuclear collisions for 0.1 to 1000 MeV protons, Air Force Weapons Laboratory, Report AFWL-TR-65-150 (1966).

    Google Scholar 

  5. L. C. Northcliffe and R. F. Schilling, Range and stopping-power tables for heavy ions, Nuclear Data Tables 7, 233 (1970).

    Article  CAS  Google Scholar 

  6. W. H. Bragg and R. Kleeman, On a particles of radium, and their loss of range in passing through various atoms and molecules, Phil. Mag. 10, 318 (1905).

    CAS  Google Scholar 

  7. J. Lindhard, Influence of crystal lattice on motion of energetic charged particles, Mat. Fys. Medd: Dansk. Vid. Selsk. 34 (1965).

    Google Scholar 

  8. D. A. Thompson, H. D. Barber, and W. D. Mackintosh, The determination of surface contamination on silicon by large angle ion scattering, Appl. Phys. Letters 14, 102 (1969).

    Article  CAS  Google Scholar 

  9. O. U. Anders, Use of charged particles from a 2-megavolt Van de Graaff accelerator for elemental surface analysis, Anal. Chem. 38, 1442 (1966).

    Article  CAS  Google Scholar 

  10. M. Peisach and D. O. Poole, Analysis of surfaces by scattering of accelerated alpha particles, Anal. Chem. 38, 1345 (1966).

    Article  CAS  Google Scholar 

  11. D.J. Ball, T. M. Buck, and G. H. Wheatley, Studies of solid surfaces with 100 keV He+ and H+ ion beams, Surface Science 30, 69 (1972).

    Article  CAS  Google Scholar 

  12. M. A. Nicolet, J. W. Mayer, and I. V. Mitchell, Microanalysis of materials by backscattering spectrometry, Science 117, 841 (1972).

    Article  Google Scholar 

  13. F. Brown and W. D. Mackintosh, The use of Rutherford backscattering methods to study the behavior of ion implanted marker atoms during anodic oxidation of aluminum; Ar, Kr, Xe, K, Rb, Cr, Cl, Br, and I, J. Electrochem. Soc. 120, 1096 (1973).

    Article  CAS  Google Scholar 

  14. J. Gyulai, O. Meyer, and J. W. Mayer, Analysis of silicon nitride layers on silicon by backscattering and channeling effect measurements, Appl. Phys. Letters 16, 232 (1970).

    Article  CAS  Google Scholar 

  15. R. F. Sippel, Diffusion measurements in the system Cu-Au by elastic scattering, Phys. Rev. 115, 1441 (1959).

    Article  CAS  Google Scholar 

  16. J. F. Ziegler and J. E. E. Baglin, Determination of surface impurity concentration profiles by nuclear backscattering, J. Appl. Phys. 42, 2031 (1971).

    Article  CAS  Google Scholar 

  17. J. Gyulai, J. W. Mayer, V. Rodriguex, A. Y. C. Yu, and H.J. Gopen, Alloying behavior of Au and Au-Ge on GaAs, J. Appl. Phys. 42, 3578 (1971).

    Article  CAS  Google Scholar 

  18. R. W. Bower and J. W. Mayer, Growth kinetics observed in the formation of metal silicides on silicon, Appl. Phys. Letters 20, 359 (1972).

    Article  CAS  Google Scholar 

  19. W. D. Mackintosh and J. A. Davies, Rutherford scattering and channeling—A useful combination for chemical analysis of surfaces, Anal. Chem. 41, 26A (1969).

    CAS  Google Scholar 

  20. J. A. Davies, J. Denhartog, L. Eriksson, and J. W. Mayer, Ion implantation of silicon, I. Atom location and lattice disorder by means of 1.0 MeV helium ion scattering, Can. J. Phys. 45, 4053 (1967).

    Article  Google Scholar 

  21. J. W. Mayer, L. Eriksson, and J. A. Davies, Ion Implantation in Semiconductors, Academic Press, New York (1970).

    Google Scholar 

  22. Atomic Collision and Penetration Studies, Proceedings of the International Conference on Atomic Collision and Penetration Studies with Energetic (keV) Ion Beams. University of Toronto Press (1968).

    Google Scholar 

  23. D. W. Palmer, M. W. Thompson, and P. D. Townsend (ed.), Atomic Collision Phenomena in Solids, American Elsevier, New York (1970).

    Google Scholar 

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© 1974 Plenum Press, New York

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Mackintosh, W.D. (1974). Rutherford Scattering. In: Kane, P.F., Larrabee, G.B. (eds) Characterization of Solid Surfaces. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-4490-2_17

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  • DOI: https://doi.org/10.1007/978-1-4613-4490-2_17

  • Publisher Name: Springer, Boston, MA

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