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Special Techniques in the X-Ray Analysis of Samples

  • J. I. Goldstein
  • J. W. Colby

Abstract

The x-ray signals obtained from the SEM-EPMA are most often used either to identify the elements present in a sample or to measure the relative or actual amounts of these elements in localized areas of the sample. The methods for determining the presence of a given element by the wavelength-or energy-dispersive method have been described in previous chapters. Similarly, the methods of scanning x-ray analysis and quantitative analysis have been discussed in some detail (Chapters IX–XI).

Keywords

Trace Element Analysis Mass Absorption Coefficient Silicon Monoxide Instrument Response Function Mass Thickness 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Plenum Press, New York 1975

Authors and Affiliations

  • J. I. Goldstein
    • 1
  • J. W. Colby
    • 2
  1. 1.Metallurgy and Materials Science DepartmentLehigh UniversityBethlehemUSA
  2. 2.Bell Telephone LaboratoriesAllentownUSA

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