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Special Techniques in the X-Ray Analysis of Samples

  • Chapter
Practical Scanning Electron Microscopy

Abstract

The x-ray signals obtained from the SEM-EPMA are most often used either to identify the elements present in a sample or to measure the relative or actual amounts of these elements in localized areas of the sample. The methods for determining the presence of a given element by the wavelength-or energy-dispersive method have been described in previous chapters. Similarly, the methods of scanning x-ray analysis and quantitative analysis have been discussed in some detail (Chapters IX–XI).

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Author information

Authors and Affiliations

  1. Metallurgy and Materials Science Department, Lehigh University, Bethlehem, Pennsylvania, USA

    J. I. Goldstein

  2. Bell Telephone Laboratories, Allentown, Pennsylvania, USA

    J. W. Colby

Authors
  1. J. I. Goldstein
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  2. J. W. Colby
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Editor information

Editors and Affiliations

  1. Metallurgy and Materials Science Department, Lehigh University, Bethlehem, Pennsylvania, USA

    Joseph I. Goldstein

  2. U.S Deparment of Commerce, National Bureau of Standards, Washington D.C., USA

    Harvey Yakowitz

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© 1975 Plenum Press, New York

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Goldstein, J.I., Colby, J.W. (1975). Special Techniques in the X-Ray Analysis of Samples. In: Goldstein, J.I., Yakowitz, H. (eds) Practical Scanning Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-4422-3_12

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  • DOI: https://doi.org/10.1007/978-1-4613-4422-3_12

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-4424-7

  • Online ISBN: 978-1-4613-4422-3

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